Deep level transient spectroscopy assessment of silicon contamination in AlGaAs layers grown by metalorganic vapor phase epitaxy
1995 ◽
Vol 24
(8)
◽
pp. 1017-1022
◽
1995 ◽
Vol 34
(Part 2, No. 7A)
◽
pp. L827-L829
◽
2009 ◽
Vol 404
(23-24)
◽
pp. 4889-4891
◽
2000 ◽
Vol 180
(1)
◽
pp. 15-19
◽
Keyword(s):
Keyword(s):
Keyword(s):