Laser interferometer with a high-resolution optical microscope for measuring small line scales

1997 ◽  
Vol 40 (9) ◽  
pp. 852-855
Author(s):  
L. Yu. Abramova ◽  
V. M. Baratov ◽  
V. L. Fedorin ◽  
L. F. Khavinson
Keyword(s):  
High Resolution ◽  
Laser Interferometer ◽  
Optical Microscope

Cosmetology treatments on human hair: An SEM study

1996 ◽  
Vol 54 ◽  
pp. 940-941
Author(s):  
D.F. Bowling
Keyword(s):  
High School ◽  
High Resolution ◽  
Human Hair ◽  
Optical Microscope ◽  
Convincing Evidence ◽  
Brightness Contrast ◽  
Sem Study

High school cosmetology students study the methods and effects of various human hair treatments, including permanents, straightening, conditioning, coloring and cutting. Although they are provided with textbook examples of overtreatment and numerous hair disorders and diseases, a view of an individual hair at the high resolution offered by an SEM provides convincing evidence of the hair‘s altered structure. Magnifications up to 2000X provide dramatic differences in perspective. A good quality classroom optical microscope can be very informative at lower resolutions.Students in a cosmetology class are initially split into two groups. One group is taught basic controls on the SEM (focus, magnification, brightness, contrast, specimen X, Y, and Z axis movements). A healthy, untreated piece of hair is initially examined on the SEM The second group cements a piece of their own hair on a stub. The samples are dryed quickly using heat or vacuum while the groups trade places and activities.

New form of Transmission Cross Coefficient for High-Resolution Imaging

1990 ◽  
Vol 48 (1) ◽  
pp. 60-61
Author(s):  
Kazuo Ishizuka
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Function ◽  
Incident Beam ◽  
Optical Microscope ◽  
Strong Interactions ◽  
Small Range ◽  
Specimen Thickness ◽  
Beam Direction ◽  
Diffracted Waves

It is well known that taking into account spacial and temporal coherency of illumination as well as the wave aberration is important to interpret an image of a high-resolution electron microscope (HREM). This occues, because coherency of incident electrons restricts transmission of image information. Due to its large spherical and chromatic aberrations, the electron microscope requires higher coherency than the optical microscope. On an application of HREM for a strong scattering object, we have to estimate the contribution of the interference between the diffracted waves on an image formation. The contribution of each pair of diffracted waves may be properly represented by the transmission cross coefficients (TCC) between these waves. In this report, we will show an improved form of the TCC including second order derivatives, and compare it with the first order TCC.In the electron microscope the specimen is illuminated by quasi monochromatic electrons having a small range of illumination directions. Thus, the image intensity for each energy and each incident direction should be summed to give an intensity to be observed. However, this is a time consuming process, if the ranges of incident energy and/or illumination direction are large. To avoid this difficulty, we can use the TCC by assuming that a transmission function of the specimen does not depend on the incident beam direction. This is not always true, because dynamical scattering is important owing to strong interactions of electrons with the specimen. However, in the case of HREM, both the specimen thickness and the illumination angle should be small. Therefore we may neglect the dependency of the transmission function on the incident beam direction.

scholarly journals High-Resolution Petrographic Evidence Confirming Detrital and Biogenic Magnetites as Remanence Carriers for Zongpu Carbonates in the Gamba Area, South Tibet

2021 ◽  
Vol 9 ◽  
Author(s):  
Qian Zhao ◽  
Baochun Huang ◽  
Zhiyu Yi ◽  
Pengfei Xue
Keyword(s):  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Early Stage ◽  
Electron Microscopic Observation ◽  
Optical Microscope ◽  
Magnetic Minerals ◽  
Electron Microscopic ◽  
Magnetic Carriers ◽  
Magnetic Extraction ◽  
South Tibet

Paleocene carbonates from the Gamba area of South Tibet provide the largest paleomagnetic dataset for constraining the paleogeography of the India-Asia collision in the early stage. Previous studies argued that the characteristic remanences (ChRMs) obtained from this unit were remagnetized via orogenic fluids. This study carries out a high-resolution petrographic study on the Paleocene carbonates from Gamba aiming to test the nature of the ChRMs. Electron microscopic observation on magnetic extracts identified a large amount of detrital magnetite that are multi- to single domain in sizes and nanoscale biogenic magnetite. Minor framboidal iron oxides were also identified, which were previously interpreted as authigenic magnetite that substitutes pyrite. However, our scanning and transmission electron microscopic (SEM/TEM) observations, along with optical microscope and Raman spectrum investigations further suggest that these magnetic minerals are pigmentary hematite and goethite that are incapable of carrying a stable primary magnetization. We therefore argue that the ChRMs of the limestones from the Zongpu Formation in the Gamba area are carried by detrital and biogenic magnetites rather than authigenic magnetite. The paleomagnetic data from the Gamba area are interpreted as primary origin and can thus be used for tectonic reconstructions. We emphasize that magnetic extraction, integrated with advanced mineralogic studies (e.g., electron backscatter diffraction and electron diffraction) are effective approaches for investigating the origin of magnetic carriers in carbonate rocks.

Creep rate spectroscopy using a laser interferometer as ultra-high resolution technique for study of relaxations

1997 ◽  
Vol 119 (1) ◽  
pp. 79-87 ◽  
Author(s):  
Nina N. Peschanskaya ◽  
Pavel N. Yakushev ◽  
Alfred B. Sinani ◽  
Vladimir A. Bershtein
Keyword(s):  
High Resolution ◽  
Creep Rate ◽  
Laser Interferometer ◽  
High Resolution Technique

Newly Automated EPMA with Phase Identification System

2001 ◽  
Vol 7 (S2) ◽  
pp. 980-981
Author(s):  
S. Notoya ◽  
H. Takahashi ◽  
T. Okumura ◽  
C.H. Nielsen
Keyword(s):  
High Resolution ◽  
Optical Microscope ◽  
Image Display ◽  
Identification System ◽  
Phase Identification ◽  
Analysis Software ◽  
X Ray ◽  
Electron Probe Microanalyzer ◽  
Mouse Pointer ◽  
Live Image

We have developed a new Electron Probe Microanalyzer (EPMA), JXA-8100/8200, with improved basic capabilities such as X-ray intensities of wavelength dispersive spectrometers (WDS), imaging functions, automated functions and analysis software. Fig. 1 shows the appearance of JXA-8200, WD/ED combined microanalyzer. in this session, we report mainly on the improved imaging functions, automated functions and analysis software.The JXA-8100/8200 is the first EPMA in the world to feature 1280 x 1024 pixels high resolution live scanning image display. Regarding scanning image, two or four different signal live images, of course including X-ray images, can be displayed simultaneously. Further, image mixing is also possible to display. On the high resolution image, an operator can choose the probe position or the stage position by mouse clicking. The stage position can also be chosen on the optical microscope (OM) live image. Another new “Swing Mouse” function, which is the seamless movement of mouse pointer between the scanning image display and the computer display, has been developed.Advanced automated functions, such as autofocus, auto astigmatism and auto contrast brightness, are effective to optimize the scanning image.

High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope

2000 ◽  
Vol 39 (Part 1, No. 6A) ◽  
pp. 3599-3602 ◽  
Author(s):  
Toshiyasu Tadokoro ◽  
Toshiharu Saiki ◽  
Keiichiro Yusu ◽  
Katsutaro Ichihara
Keyword(s):  
High Resolution ◽  
Phase Change ◽  
Near Field ◽  
Optical Microscope
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