Influence of oxygen concentration on optical properties of semi-insulating polycrystalline silicon films

1996 ◽  
Vol 63 (5) ◽  
pp. 495-503 ◽  
Author(s):  
A. Kučírková ◽  
K. Navrátil ◽  
L. Pajasová ◽  
V. Vorlíček
Keyword(s):  
Optical Properties ◽  
Oxygen Concentration ◽  
Polycrystalline Silicon ◽  
Silicon Films ◽  
Polycrystalline Silicon Films

scholarly journals Effect of hydrogen dilution on structure and optical properties of polycrystalline silicon films

2006 ◽  
Vol 55 (5) ◽  
pp. 2523
Author(s):  
Huang Rui ◽  
Lin Xuan-Ying ◽  
Yu Yun-Peng ◽  
Lin Kui-Xun ◽  
Zhu Zu-Song ◽  
...  
Keyword(s):  
Optical Properties ◽  
Polycrystalline Silicon ◽  
Silicon Films ◽  
Hydrogen Dilution ◽  
Polycrystalline Silicon Films

On the optical properties of SLS ELA polycrystalline silicon films

2012 ◽  
Vol 90 ◽  
pp. 69-71 ◽  
Author(s):  
Despina C. Moschou ◽  
Nikolaos Vourdas ◽  
Dimitrios Davazoglou ◽  
Dimitrios N. Kouvatsos ◽  
Vassilis Emm. Vamvakas ◽  
...  
Keyword(s):  
Optical Properties ◽  
Polycrystalline Silicon ◽  
Silicon Films ◽  
Polycrystalline Silicon Films

Interface morphology of thermal oxide grown on polycrystalline silicon by different processes

1992 ◽  
Vol 50 (2) ◽  
pp. 1396-1397
Author(s):  
H. Yen ◽  
E. P. Kvam ◽  
R. Bashir ◽  
S. Venkatesan ◽  
G. W. Neudeck
Keyword(s):  
Integrated Circuits ◽  
Polycrystalline Silicon ◽  
Silicon Films ◽  
Interface Morphology ◽  
Oxide Interface ◽  
Poly Silicon ◽  
Thermal Oxide ◽  
Grain Orientations ◽  
Polycrystalline Silicon Films ◽  
P Type

Polycrystalline silicon, when highly doped, is commonly used in microelectronics applications such as gates and interconnects. The packing density of integrated circuits can be enhanced by fabricating multilevel polycrystalline silicon films separated by insulating SiO2 layers. It has been found that device performance and electrical properties are strongly affected by the interface morphology between polycrystalline silicon and SiO2. As a thermal oxide layer is grown, the poly silicon is consumed, and there is a volume expansion of the oxide relative to the atomic silicon. Roughness at the poly silicon/thermal oxide interface can be severely deleterious due to stresses induced by the volume change during oxidation. Further, grain orientations and grain boundaries may alter oxidation kinetics, which will also affect roughness, and thus stress.Three groups of polycrystalline silicon films were deposited by LPCVD after growing thermal oxide on p-type wafers. The films were doped with phosphorus or arsenic by three different methods.

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