Three-beam X-ray standing wave analysis: A two dimensional determination of atomic positions

1987 ◽  
Vol 66 (1) ◽  
pp. 83-89 ◽  
Author(s):  
N. Greiser ◽  
G. Materlik
Keyword(s):  
Standing Wave ◽  
Two Dimensional ◽  
Wave Analysis ◽  
X Ray

scholarly journals Structure determination of theCoSi2:Si(111) interface by x-ray standing-wave analysis

1987 ◽  
Vol 36 (9) ◽  
pp. 4769-4773 ◽  
Author(s):  
A. E. M. J. Fischer ◽  
E. Vlieg ◽  
J. F. van der Veen ◽  
M. Clausnitzer ◽  
G. Materlik
Keyword(s):  
Standing Wave ◽  
Structure Determination ◽  
Wave Analysis ◽  
X Ray

X-ray standing wave analysis of the GaAs/Si interface

1991 ◽  
Vol 251-252 ◽  
pp. A317-A318
Author(s):  
Tomoaki Kawamura ◽  
Yukio Fukuda ◽  
Masaharu Oshima ◽  
Yoshiro Ohmachi ◽  
Izumi Koichi ◽  
...  
Keyword(s):  
Standing Wave ◽  
Wave Analysis ◽  
X Ray

Chemical-state-resolved x-ray standing-wave analysis using chemical shift in photoelectron spectra

1995 ◽  
Vol 51 (20) ◽  
pp. 14778-14781 ◽  
Author(s):  
Munehiro Sugiyama ◽  
Satoshi Maeyama ◽  
Stefan Heun ◽  
Masaharu Oshima
Keyword(s):  
Chemical Shift ◽  
Standing Wave ◽  
Chemical State ◽  
Photoelectron Spectra ◽  
Wave Analysis ◽  
X Ray

Determination of preferential molecular orientation in porphyrin-fullerene dyad ZnDHD6ee monolayers by the X-ray standing-wave method and X-ray reflectometry

2013 ◽  
Vol 58 (6) ◽  
pp. 934-938 ◽  
Author(s):  
A. Yu. Seregin ◽  
Yu. A. D’yakova ◽  
S. N. Yakunin ◽  
I. A. Makhotkin ◽  
A. S. Alekseev ◽  
...  
Keyword(s):  
Standing Wave ◽  
Molecular Orientation ◽  
Wave Method ◽  
X Ray ◽  
Standing Wave Method

scholarly journals Determination of hard X-ray polarization from two-dimensional images

2020 ◽  
Vol 53 (6) ◽  
pp. 1559-1561
Author(s):  
Robert B. Von Dreele ◽  
Wenqian Xu
Keyword(s):  
Incident Beam ◽  
Beam Polarization ◽  
Two Dimensional ◽  
One Dimensional ◽  
X Ray ◽  
Dimensional Image ◽  
Two Dimensional Image ◽  
The Difference ◽  
Two Dimensional Images

An estimate of synchrotron hard X-ray incident beam polarization is obtained by partial two-dimensional image masking followed by integration. With the correct polarization applied to each pixel in the image, the resulting one-dimensional pattern shows no discontinuities arising from the application of the mask. Minimization of the difference between the sums of the masked and unmasked powder patterns allows estimation of the polarization to ±0.001.

scholarly journals Exafs Studies of Multilayer Interfaces

1988 ◽  
Vol 143 ◽  
Author(s):  
S. M. Heald ◽  
G. M. Lamble
Keyword(s):  
Fine Structure ◽  
Standing Wave ◽  
Structural Disorder ◽  
Interface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
High Degree ◽  
X Ray Absorption ◽  
Multilayer Materials

AbstractImportant for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.

scholarly journals Comparative X-ray Standing Wave Analysis of Metal−Phosphonate Multilayer Films of Dodecane and Porphyrin Molecular Square

2005 ◽  
Vol 109 (4) ◽  
pp. 1441-1450 ◽  
Author(s):  
Joseph A. Libera ◽  
Richard W. Gurney ◽  
Craig Schwartz ◽  
Hua Jin ◽  
Tien-Lin Lee ◽  
...  
Keyword(s):  
Standing Wave ◽  
Multilayer Films ◽  
Wave Analysis ◽  
X Ray ◽  
Metal Phosphonate ◽  
Molecular Square
Sign in / Sign up

Export Citation Format

Share Document