Flicker noise sources in bipolar transistors

1986 ◽  
Vol 29 (6) ◽  
pp. 510-517 ◽  
Author(s):  
N. N. Bogoslovskii ◽  
A. V. Yakimov
Keyword(s):  
Flicker Noise ◽  
Bipolar Transistors ◽  
Noise Sources

Investigation of flicker-noise sources in a reflex klystron

1974 ◽  
Vol 17 (5) ◽  
pp. 569-578
Author(s):  
V. A. Berdnikova ◽  
S. A. Kornilov ◽  
S. D. Uman
Keyword(s):  
Flicker Noise ◽  
Noise Sources ◽  
Reflex Klystron

Experimental Studies of Excess Noise Sources in Concrete Based Materials as a Limiting Factor for Electromagnetic Emission Measurement

2013 ◽  
Vol 592-593 ◽  
pp. 529-532
Author(s):  
Robert Macků ◽  
Pavel Koktavý ◽  
Tomas Trčka ◽  
Vladimir Holcman
Keyword(s):  
Flicker Noise ◽  
Noise Analysis ◽  
Experimental Studies ◽  
Electromagnetic Emission ◽  
Dielectric Materials ◽  
Excess Noise ◽  
Limiting Factor ◽  
Emission Measurement ◽  
Noise Sources ◽  
Geometrical Properties

This paper deals with excess noise sources in dielectric materials. We focus especially on the concrete samples that are frequently tested to ensure information about the reliability and level of degradation. Nevertheless, the testing methods are limited mainly by the proper contact creation, signal detection and noise defined sensitivity. Our efforts are directed to the noise properties assessment. It turns out that the Johnson-Nyquist noise and the 1/f (flicker) noise are generated in the different regions with the different response to the internal or external electric field. In addition the noise analysis is affected by the internal polarization phenomena and the material residual humidity. This issue in connection with the sample geometrical properties and the dielectric noise measurement methodology take part in this paper.

A Detailed Study of Noise Sources in Selective Line Modulation Atomic Spectrometry

1986 ◽  
Vol 40 (8) ◽  
pp. 1117-1126 ◽  
Author(s):  
A. W. Steele ◽  
G. M. Hieftje
Keyword(s):  
Background Radiation ◽  
Flicker Noise ◽  
Atomic Emission ◽  
Atomic Spectrometry ◽  
Emission Spectrometry ◽  
High Signal ◽  
Readout System ◽  
Noise Sources ◽  
Experimental Conditions ◽  
Atom Absorption

A detailed theoretical study is presented of the noise sources present in selective spectral line modulation (SLM) atomic emission spectrometry. Shot and flicker noise terms associated with the signal and background radiation, the modulating-reservoir transmission, the modulating-reservoir atom emission, the modulating-atom absorption, and the readout system are considered and compared. The results of the study reveal that shot noise never limits the precision of an SLM experiment. Instead, precision at high signal levels is limited by flicker noise associated with the modulating-atom reservoir transmission, the modulating-atom absorption, and the primary emission signal. In contrast, precision near the detection limit is limited by flicker noise associated with the modulating-atom emission and the background emission from the source and modulating-atom reservoir. The relative magnitudes of these noise sources were found to vary considerably with experimental conditions. Experimental data on four elements (Bi, Mg, Cu, Ag) are presented and compared. General trends of the noise magnitudes with experimental conditions are discussed and findings are extended to other elements that can be determined by the SLM method.

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