Auto-acceleration in shock excitation of a system of strip lines by a strong electron beam

1976 ◽  
Vol 19 (7) ◽  
pp. 751-755
Author(s):  
N. N. Nasonov ◽  
A. M. Shenderovich
Keyword(s):  
Electron Beam ◽  
Strong Electron ◽  
Shock Excitation ◽  
Strip Lines ◽  
Strong Electron Beam

Analytical TEM Observation of Gold Nano-Particles on Cerium Oxide

2005 ◽  
Vol 900 ◽  
Author(s):  
Tomoki Akita ◽  
Koji Tanaka ◽  
Masanori Kohyama ◽  
Masatake Haruta
Keyword(s):  
Electron Beam ◽  
Cerium Oxide ◽  
Electron Beam Irradiation ◽  
Shape Change ◽  
Atomic Layer ◽  
Nano Particles ◽  
Beam Irradiation ◽  
Strong Electron ◽  
Transmission Electron ◽  
Strong Electron Beam

ABSTRACTThe structure of Au nano-particles supported on CeO2 was investigated by using an analytical transmission electron microscope (TEM). The shape change of Au particles was observed during TEM observation, such as shrinking down to a mono-atomic layer on the CeO2 substrate. The electron beam irradiation experiment revealed that the shape change of Au particles is concerning with the oxidation state or the density of oxygen vacancies of CeO2 substrate where the rapid desorption and adsorption of oxygen occurs. It was also found that the reduction by strong electron beam irradiation and subsequent oxidation generate the decoration of Au particles by cerium oxide.

Interaction of a strong electron beam with a plasma

1962 ◽  
Vol 16 (3) ◽  
pp. 179
Author(s):  
A.K. Berezin ◽  
Ya.B. Fainberg ◽  
G.P. Berezina ◽  
L.I. Bolotin
Keyword(s):  
Electron Beam ◽  
Strong Electron ◽  
Strong Electron Beam

Self-acceleration experiment of a strong electron beam in a ferrite accelerating structure

1976 ◽  
Vol 40 (1) ◽  
pp. 63-65 ◽  
Author(s):  
V. V. Zakutin ◽  
N. N. Nasonov ◽  
A. A. Rakityanskii ◽  
A. M. Shenderovich
Keyword(s):  
Electron Beam ◽  
Strong Electron ◽  
Accelerating Structure ◽  
Strong Electron Beam

Temperature measurement of Ta, Al and Cu target stricken by strong electron beam

2014 ◽  
Vol 26 (2) ◽  
pp. 24001
Author(s):  
王荣波 Wang Rongbo ◽  
朱隽 Zhu Jun ◽  
周维军 Zhou Weijun ◽  
吴廷烈 Wu Tinglie ◽  
田建华 Tian Jianhua ◽  
...  
Keyword(s):  
Electron Beam ◽  
Temperature Measurement ◽  
Strong Electron ◽  
Strong Electron Beam

scholarly journals Tunable High Spatio-Spectral Purity Undulator Radiation from a Transported Laser Plasma Accelerated Electron Beam

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
A. Ghaith ◽  
D. Oumbarek ◽  
E. Roussel ◽  
S. Corde ◽  
M. Labat ◽  
...  
Keyword(s):  
Electron Beam ◽  
Laser Plasma ◽  
Second Harmonic ◽  
Spectral Signature ◽  
Light Sources ◽  
Spectral Brightness ◽  
Spectral Purity ◽  
Strong Electron ◽  
Undulator Radiation ◽  
Transport Line

AbstractUndulator based synchrotron light sources and Free Electron Lasers (FELs) are valuable modern probes of matter with high temporal and spatial resolution. Laser Plasma Accelerators (LPAs), delivering GeV electron beams in few centimeters, are good candidates for future compact light sources. However the barriers set by the large energy spread, divergence and shot-to-shot fluctuations require a specific transport line, to shape the electron beam phase space for achieving ultrashort undulator synchrotron radiation suitable for users and even for achieving FEL amplification. Proof-of-principle LPA based undulator emission, with strong electron focusing or transport, does not yet exhibit the full specific radiation properties. We report on the generation of undulator radiation with an LPA beam based manipulation in a dedicated transport line with versatile properties. After evidencing the specific spatio-spectral signature, we tune the resonant wavelength within 200–300 nm by modification of the electron beam energy and the undulator field. We achieve a wavelength stability of 2.6%. We demonstrate that we can control the spatio-spectral purity and spectral brightness by reducing the energy range inside the chicane. We have also observed the second harmonic emission of the undulator.

Novel Nanocarbons: Global Topology and Curvature Perspectives

2006 ◽  
Vol 960 ◽  
Author(s):  
Sanju Gupta ◽  
A. Saxena
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Raman Band ◽  
Resonance Raman Spectroscopy ◽  
Experimental Studies ◽  
Pressure Sensors ◽  
High Energy ◽  
Strong Electron ◽  
Space Applications ◽  
Global Topology

ABSTRACTCarbon nanotubes (both the single- and multi-walled), in the family of nanostructured carbons, are of great interest because of several unsurpassable physical properties and it needs to be shown that they are physically stable and structurally unaltered when subjected to radiation. In addition to testing them for space applications, when exposed to high energy electron beam from transmission electron microscopy, the results seem quite promising in terms of nano-engineering/ nano-manufacturing for producing novel nanocarbons [1-3]. Experimental studies of effects of electron beam irradiation on carbon nanotubes show that multi-walled ones tend to be relatively more robust than their single-walled kins. The increased exposure on an individual bundle of single-wall nanotubes promoted graphitization, pinching, and cross-linking analogous to polymers forming an intra-molecular junction (IMJ) within the area of electron beam focus, possibly through aggregates of amorphous carbon [2,3]. Formation of novel nanostructures (nano-ring and helix-like) due to irradiation are observed. These studies shed light on the dynamics of nanomanufacturing and a regime of possible relevance of these materials for: (i) short-term space missions; (ii) radiation hard programmable logic circuits; and (iii) radiation pressure sensors. It is suggestive that a local reorganization occurs. Through resonance Raman spectroscopy and related techniques we also elucidate an important notion of global topology and curvature at nanoscale which points to an emergent paradigm of Curvature/Topology → Property → Functionality in these technologically important geometries of carbons: nanotubes, fullerenes, nanorings, nanocones, nanohorns and nanodisks. To this end, we have determined the variation in first order high frequency Raman band which indicates a strong electron-phonon coupling. These concepts also apply to nanostructures of other “topological materials” such as BN nanotubes and nanotori, helical gold nanotubes as well as Möbius conjugated polymers.

scholarly journals The importance of EBIT data for Z-pinch plasma diagnostics

2008 ◽  
Vol 86 (1) ◽  
pp. 267-276 ◽  
Author(s):  
A S Safronova ◽  
V L Kantsyrev ◽  
P Neill ◽  
U I Safronova ◽  
D A Fedin ◽  
...  
Keyword(s):  
Electron Beam ◽  
Lawrence Livermore National Laboratory ◽  
National Laboratory ◽  
Theoretical Models ◽  
High Energy ◽  
High Energy Density ◽  
Strong Electron ◽  
Model Calculations ◽  
X Ray ◽  
Z Pinch

The results from the last six years of X-ray spectroscopy and spectropolarimetry of high-energy density Z-pinch plasmas complemented by experiments with the electron beam ion trap (EBIT) at the Lawrence Livermore National Laboratory (LLNL) are presented. The two topics discussed are the development of M-shell X-ray W spectroscopic diagnostics and K-shell Ti spectropolarimetry of Z-pinch plasmas. The main focus is on radiation from a specific load configuration called an “X-pinch”. In this work the study of X-pinches with tungsten wires combined with wires from other, lower Z materials is reported. Utilizing data produced with the LLNL EBIT at different energies of the electron beam the theoretical prediction of line positions and intensity of M-shell W spectra were tested and calibrated. Polarization-sensitive X-pinch experiments at the University of Nevada, Reno (UNR) provide experimental evidence for the existence of strong electron beams in Ti and Mo X-pinch plasmas and motivate the development of X-ray spectropolarimetry of Z-pinch plasmas. This diagnostic is based on the measurement of spectra recorded simultaneously by two spectrometers with different sensitivity to the linear polarization of the observed lines and compared with theoretical models of polarization-dependent spectra. Polarization-dependent K-shell spectra from Ti X-pinches are presented and compared with model calculations and with spectra generated by a quasi-Maxwellian electron beam at the LLNL EBIT-II electron beam ion trap.PACS Nos.: 32.30.Rj, 52.58.Lq, 52.70.La

Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

1971 ◽  
Vol 29 ◽  
pp. 204-205
Author(s):  
G. G. Shaw
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Aluminum Alloy ◽  
Electron Beam ◽  
Pure Aluminum ◽  
Ion Milling ◽  
Transmission Electron ◽  
Fiber Matrix ◽  
Ion Erosion ◽  
Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

Temperature Dependence of the Critical Electron Dose for Fatty Acid Monolayers

1982 ◽  
Vol 40 ◽  
pp. 78-79
Author(s):  
Kenneth H. Downing ◽  
Robert M. Glaeser
Keyword(s):  
Electron Beam ◽  
Fatty Acid ◽  
Inelastic Scattering ◽  
Temperature Dependence ◽  
Structural Damage ◽  
Direct Result ◽  
Second Step ◽  
Strong Temperature Dependence ◽  
Electron Dose ◽  
Covalent Bonds

The structural damage of molecules irradiated by electrons is generally considered to occur in two steps. The direct result of inelastic scattering events is the disruption of covalent bonds. Following changes in bond structure, movement of the constituent atoms produces permanent distortions of the molecules. Since at least the second step should show a strong temperature dependence, it was to be expected that cooling a specimen should extend its lifetime in the electron beam. This result has been found in a large number of experiments, but the degree to which cooling the specimen enhances its resistance to radiation damage has been found to vary widely with specimen types.

Lithography below 100 nm

1983 ◽  
Vol 41 ◽  
pp. 96-99
Author(s):  
L. D. Jackel
Keyword(s):  
Spatial Distribution ◽  
Electron Beam ◽  
Electron Scattering ◽  
Electron Beam Lithography ◽  
Substrate Material ◽  
Local Electron ◽  
Electron Dose ◽  
Positive Resist ◽  
Exposure Process

Most production electron beam lithography systems can pattern minimum features a few tenths of a micron across. Linewidth in these systems is usually limited by the quality of the exposing beam and by electron scattering in the resist and substrate. By using a smaller spot along with exposure techniques that minimize scattering and its effects, laboratory e-beam lithography systems can now make features hundredths of a micron wide on standard substrate material. This talk will outline sane of these high- resolution e-beam lithography techniques.We first consider parameters of the exposure process that limit resolution in organic resists. For concreteness suppose that we have a “positive” resist in which exposing electrons break bonds in the resist molecules thus increasing the exposed resist's solubility in a developer. Ihe attainable resolution is obviously limited by the overall width of the exposing beam, but the spatial distribution of the beam intensity, the beam “profile” , also contributes to the resolution. Depending on the local electron dose, more or less resist bonds are broken resulting in slower or faster dissolution in the developer.

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