Effect of residual oxygen on the formation of molecular ions in secondary ion mass spectrometry

1975 ◽  
Vol 8 (4) ◽  
pp. 361-362 ◽  
Author(s):  
M. Prager
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Residual Oxygen ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Molecular surface analysis by TOF-SIMS

1992 ◽  
Vol 50 (2) ◽  
pp. 1556-1557
Author(s):  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Molecular Surface ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Static Conditions ◽  
Primary Ions ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2. Since typical solid surfaces have an atomic density of 1015 atoms/cm2, this primary ion dose nominally removes less than 0.1% of a monolayer. Hence, SIMS analyses performed under these static conditions represent near surface analysis in which secondary ions are produced from the top few monolayers of the surface. The actual sampling depth is determined by the primary ion momentum, angle of incidence and chemistry of the surface. Since low dose primary ions cause minimal perturbation of the chemistry of the solid surface, SSIMS analyses often produce molecular or pseudo-molecular ions characteristic of the chemical composition of the surface. Thus, molecular ions or structurally significant fragment ions are often observed in SSIMS analyses of surfaces containing inorganic and organic residues, polymers surfaces, coatings, and biological materials such as tissues and membranes.

Improvement of biomolecular analysis in thin films using in-situ matrix enhanced Secondary Ion Mass Spectrometry

The Analyst ◽  
2021 ◽  
Author(s):  
Konstantin Moshkunov ◽  
Benjamin Tomasetti ◽  
Thomas Daphnis ◽  
Vincent Delmez ◽  
Kevin Vanvarenberg ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Imaging Mass Spectrometry ◽  
Molecular Ions ◽  
Limiting Factor ◽  
Ion Mass Spectrometry ◽  
Resolution Imaging ◽  
Biomolecular Analysis ◽  
Secondary Ion

Sensitivity to molecular ions remains a limiting factor for high resolution imaging mass spectrometry of organic and biological materials. Here, we investigate a variant of matrix-enhanced secondary ion mass spectrometry...

Liquid Secondary Ion Mass Spectrometry and Collision-induced Dissociation Mass Spectrometry of Sulfonamide Derivatives of meso-Tetraphenylporphyrin

1999 ◽  
Vol 03 (03) ◽  
pp. 172-179 ◽  
Author(s):  
M. ROSÁRIO M. DOMINGUES ◽  
M. GRAÇA SANTANA-MARQUES ◽  
A. J. FERRRER-CORREIA ◽  
AUGUSTO C. TOMÉ ◽  
MARIA G. P. M. S. NEVES ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Mass Spectra ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Collision Induced Dissociation ◽  
Fragment Ions ◽  
Ion Mass Spectrometry ◽  
Derivatives Of ◽  
Secondary Ion

Liquid secondary ion mass spectrometry (LSIMS) and collision-induced dissociation (CID) were used for the characterization of sulfonamide derivatives of meso-tetraphenylporphyrin (TPP). The spectra obtained using LSIMS show abundant molecular ions and fragment ions from losses of the sulfonamide moieties. The main fragmentation observed in the LSI mass spectra and in the CID spectra of the protonated or cationized molecules involves the loss of one sulfonamide group. In addition, in the CID spectra of these compounds the fragment ions formed by the elimination of two, three and/or four sulfonamide groups are also observed. The CID spectra of the protonated or cationized molecules of these derivatives do not display the ions formed by the cleavage of the S - N bond which have been reported for other sulfonamide compounds. The LSI mass spectra and CID spectra of sulfonamide derivatives of meso-tetraphenylporphyrin provide an easy and reliable means of identification of the number and nature of sulfonamide groups in the porphyrinic ring.

Quantitation of major elements with secondary ion mass spectrometry by using M2+-molecular ions

1998 ◽  
Vol 9 (6) ◽  
pp. 638-642 ◽  
Author(s):  
Johan Vlekken ◽  
Ting-Di Wu ◽  
Marc D’Olieslaeger ◽  
Gilbert Knuyt ◽  
Wilfried Vandervorst ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Major Elements ◽  
Molecular Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]

1992 ◽  
Vol 47 (7) ◽  
pp. 929-936 ◽  
Author(s):  
Herbert Feld ◽  
Angelika Leute ◽  
Derk Rading ◽  
Alfred Benninghoven ◽  
G. Henkel ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Metal Complexes ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Cluster Ions ◽  
High Mass ◽  
Plasma Desorption ◽  
Ion Mass Spectrometry ◽  
Thiolate Complexes ◽  
Secondary Ion

The use of mass spectrometry for the analysis of transition metal complexes is demonstrated by combined high resolution Plasma Desorption Mass Spectrometry (PDMS) and Secondary Ion Mass Spectrometry (SIMS) investigations of the neutral nickel thiolate complexes [Ni4(SC3H7)8] (1), [Ni4(SC6H11)8] (2), [Ni8(SCH2COOEt)16] (3) and [Ni6(SC3H7)12] (4). The positive spectra are dominated by three kinds of SI-species: (a) molecular ions, (b) fragment ions and (c) molecular ions with one or more substrate atoms attached. The negative spectra show mainly nickel sulfur cluster ions of the composition (NixSy)-. In contrast to many Fast Atom Bombardment (FAB) spectra of neutral metal complexes, SIMS and PDMS spectra provide molecular weight as well as fragment ion information. Both techniques are most powerful tools for the investigation of coordination compounds because the samples are easy to prepare and the spectra are independent of matrix conditions. Additionally crystallographic studies have been carried out for 4. The hexanuclear complex 4 with square planar Ni-S coordination sites crystallizes in the trigonal space group R 3̅ with Z = 3 and α = 18.537(5), c = 13.966(3) Å.

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