An X-ray study of splat-quenched Sn-Bi and Cu-Sb alloys by energy-dispersive diffraction

1978 ◽  
Vol 13 (1) ◽  
pp. 108-112 ◽  
Author(s):  
E. Laine ◽  
I. L�hteenm�ki ◽  
I. Lehtoranta
Keyword(s):  
Energy Dispersive ◽  
X Ray ◽  
Energy Dispersive Diffraction

scholarly journals A Study of Preferred Orientation by Energy-Dispersive X-Ray Diffraction

1977 ◽  
Vol 2 (4) ◽  
pp. 243-251 ◽  
Author(s):  
E. Laine ◽  
J. Kivilä ◽  
I. Lähteenmäki
Keyword(s):  
Density Distribution ◽  
Diffraction Method ◽  
Polar Axis ◽  
Preferred Orientation ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
Powder Specimen ◽  
X Ray ◽  
Aluminium Powder ◽  
Energy Dispersive Diffraction

The influence of preferred orientation on integrated x-ray intensities in powder specimen using energy-dispersive diffraction method is investigated. The theory used is based upon examination of the polar axis density distribution. The measurements were carried out using the Schulz technique added with defocusing correction. Experimental results are given for three aluminium powder specimens.

Instrumentation for Synchrotron X-Ray Powder Diffractometry

1985 ◽  
Vol 29 ◽  
pp. 243-250 ◽  
Author(s):  
W. Parrish ◽  
M. Hart ◽  
C. G. Erickson ◽  
N. Masciocchi ◽  
T. C. Huang
Keyword(s):  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
Storage Ring ◽  
Scintillation Counter ◽  
Diffraction Method ◽  
Energy Dispersive ◽  
Parallel Beam ◽  
X Ray ◽  
Radiation Laboratory ◽  
Energy Dispersive Diffraction

AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens. The parallel beam powder diffraction was defined by horizontal parallel slits which had several times higher intensity than a receiving slit at the same resolution. The patterns were obtained with 2:1 scanning with’ a selected monochromatic beam, and an energy dispersive diffraction method in which the monochromator is step-scanned, and the specimen and scintillation counter are fixed. Both methods use the same instrumentation.

scholarly journals On the calculation of the gauge volume size for energy-dispersive X-ray diffraction

2011 ◽  
Vol 18 (6) ◽  
pp. 938-941 ◽  
Author(s):  
Matthew R. Rowles
Keyword(s):  
Energy Dispersive ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
Active Volume ◽  
X Ray ◽  
Gauge Volume ◽  
Energy Dispersive Diffraction ◽  
Volume Size

Equations for the calculation of the dimensions of a gauge volume, also known as the active volume or diffraction lozenge, in an energy-dispersive diffraction experiment where the detector is collimated by two ideal slits have been developed. Equations are given for equatorially divergent and parallel incident X-ray beams, assuming negligible axial divergence.

Energy Dispersive Diffraction in a Diamond Anvil High Pressure Cell Using Synchrotron and Conventional X-Radiation

1983 ◽  
Vol 27 ◽  
pp. 331-337
Author(s):  
David R. Black ◽  
Carmen S. Menoni ◽  
Ian L. Spain
Keyword(s):  
High Pressure ◽  
Energy Dispersive ◽  
X Rays ◽  
High Pressure Cell ◽  
X Ray ◽  
Detection Techniques ◽  
Wide Range ◽  
Diamond Anvil ◽  
Experimental Geometry ◽  
Energy Dispersive Diffraction

A wide range of structural studies have been carried out in high pressure diamond anvil cells using x-rays. The most common experimental geometry is shown in Fig. 1a. The incident x-ray beam passes axially through the first diamond and enters the sample, typically 100-300 μm in diameter and 20-100 μm thick; the diffracted x-rays exit via the second diamond. Energy-dispersive detection techniques (EDXRD) have been used. However the intensity of diffracted radiation from the sample is weak, so that typical exposure times with a conventional, fixed anode, x-ray source are typically one to several days.Accordingly, higher intensity radiation from synchrotron sources has been used for these experiments.

Analysis of Texture Depth Distribution by Energy-Dispersive Diffraction

2013 ◽  
Vol 768-769 ◽  
pp. 36-43
Author(s):  
Rodrigo Santiago Coelho ◽  
Manuela Klaus ◽  
Christoph Genzel
Keyword(s):  
Depth Distribution ◽  
High Spatial Resolution ◽  
Sample Surface ◽  
Energy Dispersive ◽  
Sample Problem ◽  
Synchrotron Diffraction ◽  
X Ray ◽  
Sampling Volume ◽  
Energy Dispersive Diffraction ◽  
Fast Access

Possibilities for depth resolving texture analysis applying energy-dispersive X-ray synchrotron diffraction are presented. Exploiting the advantage of having the complete diffraction spectra observed in a fixed but arbitrary measuring direction, two different approaches for high spatial resolution analyses are discussed. The first allows fast access of intensity distribution from plan families {hkl} parallel to the sample surface. The latter allows successful pole figure assessment despite the complex and time consuming slit alignment and data processing. The size of the sampling volume can be tailored to the sample problem ranging from 10 to 100 µm in height or more if necessary.

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