Attenuated total reflection method for measurements of optical properties of metallic films bordering anisotropic dielectrics
1996 ◽
Vol 43
(11)
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pp. 2217-2224
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1996 ◽
Vol 116
(1)
◽
pp. 55-61
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2010 ◽
Vol 130
(2)
◽
pp. 193-197
Keyword(s):
Keyword(s):
1995 ◽
Vol 115
(11)
◽
pp. 1137-1143
◽
Keyword(s):
Keyword(s):