Balance testing and balance-testable design of logic circuits

Krishnendu Chakrabarty; John P. Hayes

doi:10.1007/bf00136077

Balance testing and balance-testable design of logic circuits

Journal of Electronic Testing ◽

10.1007/bf00136077 ◽

1996 ◽

Vol 8 (1) ◽

pp. 71-86 ◽

Cited By ~ 5

Author(s):

Krishnendu Chakrabarty ◽

John P. Hayes

Keyword(s):

Logic Circuits ◽

Balance Testing ◽

Testable Design

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A testable design of logic circuits under highly observable condition

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114116 ◽

2002 ◽

Cited By ~ 5

Author(s):

W. Xiaoqing ◽

K. Kinoshita

Keyword(s):

Logic Circuits ◽

Testable Design

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Balance testing of logic circuits

FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing ◽

10.1109/ftcs.1993.627338 ◽

2002 ◽

Cited By ~ 2

Author(s):

K. Chakrabarty ◽

J.P. Hayes

Keyword(s):

Logic Circuits ◽

Balance Testing

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Cumulative balance testing of logic circuits

Microelectronics Reliability ◽

10.1016/0026-2714(96)84401-5 ◽

1996 ◽

Vol 36 (4) ◽

pp. 539

Keyword(s):

Logic Circuits ◽

Balance Testing

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Cumulative balance testing of logic circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/92.365455 ◽

1995 ◽

Vol 3 (1) ◽

pp. 72-83 ◽

Cited By ~ 10

Author(s):

K. Chakrabarty ◽

J.P. Hayes

Keyword(s):

Logic Circuits ◽

Balance Testing

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A testable design of logic circuits under highly observable condition

IEEE Transactions on Computers ◽

10.1109/12.142692 ◽

1992 ◽

Vol 41 (5) ◽

pp. 654-659 ◽

Cited By ~ 5

Author(s):

W. Xiaoqing ◽

K. Kinoshita

Keyword(s):

Logic Circuits ◽

Testable Design

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Highly testable design of BiCMOS logic circuits

IEEE Journal of Solid-State Circuits ◽

10.1109/4.293112 ◽

1994 ◽

Vol 29 (6) ◽

pp. 671-678 ◽

Cited By ~ 5

Author(s):

M.Y. Osman ◽

M.I. Elmasry

Keyword(s):

Logic Circuits ◽

Testable Design

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A new testable design of logic circuits under highly observable condition

Proceedings of IEEE 3rd Asian Test Symposium (ATS) ◽

10.1109/ats.1994.367231 ◽

2002 ◽

Author(s):

W. Xiaoqing ◽

H. Tamamoto ◽

K. Kinoshita

Keyword(s):

Logic Circuits ◽

Testable Design

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Fault effects in asynchronous sequential logic circuits

IEE Proceedings E (Computers and Digital Techniques) ◽

10.1049/ip-e.1993.0046 ◽

1993 ◽

Vol 140 (6) ◽

pp. 327-332

Author(s):

M.-D. Shieh ◽

C.-L. Wey ◽

P.D. Fisher

Keyword(s):

Logic Circuits ◽

Sequential Logic

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APPLICATIONS OF a-Si FIELD EFFECT TRANSISTORS IN LIQUID CRYSTAL DISPLAYS AND IN INTEGRATED LOGIC CIRCUITS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1981490 ◽

1981 ◽

Vol 42 (C4) ◽

pp. C4-423-C4-432 ◽

Cited By ~ 2

Author(s):

P. G. Le Comber ◽

A. J. Snell ◽

K. D. Mackenzie ◽

W. E. Spear

Keyword(s):

Liquid Crystal ◽

Field Effect ◽

Field Effect Transistors ◽

Liquid Crystal Displays ◽

Logic Circuits ◽

Integrated Logic

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An Improved Educational Support System for NAND-Based Logic Circuits

IEEJ Transactions on Fundamentals and Materials ◽

10.1541/ieejfms.130.227 ◽

2010 ◽

Vol 130 (3) ◽

pp. 227-231

Author(s):

Takashi Miyagoshi ◽

Koji Okino ◽

Masato Tajima

Keyword(s):

Support System ◽

Logic Circuits ◽

Educational Support ◽

Educational Support System

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