scholarly journals Flexible High‐Stability Self‐Variable‐Voltage Monolithic Integrated System Achieved by High‐Brightness LED for Information Transmission (Small 45/2021)

Small ◽  
2021 ◽  
Vol 17 (45) ◽  
pp. 2170238
Author(s):  
Yanqing Jia ◽  
Haibin Guo ◽  
Jing Ning ◽  
Jincheng Zhang ◽  
Dong Wang ◽  
...  
Keyword(s):  
Information Transmission ◽  
High Stability ◽  
Integrated System ◽  
High Brightness ◽  
Variable Voltage

scholarly journals Issues in Cathode Performance Part 3-Cathode Emitter Material

1995 ◽  
Vol 3 (5) ◽  
pp. 10-11
Author(s):  
Damon Heer
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Crystal Orientation ◽  
High Stability ◽  
High Brightness ◽  
High Beam ◽  
Industry Standard ◽  
Small Spot ◽  
Long Lifetime ◽  
Beam Currents

Part 1 of this article series (October 1994 issue) covered the performance features of various tip shapes and explained why the <100> crystal orientation is the industry standard. Part 2 (January/February 1995 issue) covered cathode mounting design and explained how the Mini Vogel Mount cathode design provides high-stability and long-lifetime performance.LaB6 and CeB6 cathodes are used as high-brightness, high-stability, longlifetime cathodes in a variety of electron beam applications. A high-brightness source provides small spot sizes for high resolution and improved analytical results from high beam currents.

X-Ray Microbeam Studies of Electromigration

1999 ◽  
Vol 563 ◽  
Author(s):  
G. S. Cargill III ◽  
A. C. Ho ◽  
K. J. Hwang ◽  
H. K. Kao ◽  
P.-C. Wang ◽  
...  
Keyword(s):  
High Resolution ◽  
Real Time ◽  
High Stability ◽  
Polycrystalline Metal ◽  
Optical Elements ◽  
High Brightness ◽  
X Ray ◽  
Composition Changes ◽  
Stability Energy ◽  
Made In

AbstractThe interplay between stress and electromigration has been recognized since I. A. Blech et al. used x-ray topography in 1976 to demonstrate that stress gradients developed during electromigration. Availability of high brightness synchrotron x-ray sources, high stability energy dispersive detectors, high resolution area detectors, and pinholes, capillaries and other optical elements for forming x-ray microbeams, has made possible more quantitative, real time measurements of strains and composition changes which develop in polycrystalline metal conductor lines during electromigration. This paper describes advances made in this area, implications of results which have been obtained, and prospects for further progress.

Quantum‐Dot Light‐Emitting Diodes for Outdoor Displays with High Stability at High Brightness

2019 ◽  
Vol 8 (2) ◽  
pp. 1901145 ◽  
Author(s):  
Xinyu Li ◽  
Qingli Lin ◽  
Jiaojiao Song ◽  
Huaibin Shen ◽  
Huimin Zhang ◽  
...  
Keyword(s):  
Quantum Dot ◽  
High Stability ◽  
Light Emitting Diodes ◽  
High Brightness ◽  
Light Emitting

A Stable Field Emission Electron Source

1977 ◽  
Vol 35 ◽  
pp. 58-59
Author(s):  
W.R. Bottoms ◽  
G.B. Haydon
Keyword(s):  
Field Emission ◽  
Signal To Noise Ratio ◽  
High Brightness ◽  
Electron Sources ◽  
Brightness Field ◽  
Current Densities ◽  
Properties Of Materials ◽  
Stable Field ◽  
Stable Current ◽  
Careful Design

There is great interest in improving the brightness of electron sources and therefore the ability of electron optical instrumentation to probe the properties of materials. Extensive work by Dr. Crew and others has provided extremely high brightness sources for certain kinds of analytical problems but which pose serious difficulties in other problems. These sources cannot survive in conventional system vacuums. If one wishes to gather information from the other signal channels activated by electron beam bombardment it is necessary to provide sufficient current to allow an acceptable signal-to-noise ratio. It is possible through careful design to provide a high brightness field emission source which has the capability of providing high currents as well as high current densities to a specimen. In this paper we describe an electrode to provide long-lived stable current in field emission sources.The source geometry was based upon the results of extensive computer modeling. The design attempted to maximize the total current available at a specimen.

Optical Properties of HVEM Accelerators

1975 ◽  
Vol 33 ◽  
pp. 180-181
Author(s):  
A. Strojnik ◽  
J.W. Scholl ◽  
V. Bevc
Keyword(s):  
Optical Properties ◽  
Electron Accelerator ◽  
Systematic Investigation ◽  
Electron Source ◽  
High Brightness ◽  
The Past ◽  
Wide Range ◽  
Optical Behavior

The electron accelerator, as inserted between the electron source (injector) and the imaging column of the HVEM, is usually a strong lens and should be optimized in order to ensure high brightness over a wide range of accelerating voltages and illuminating conditions. This is especially true in the case of the STEM where the brightness directly determines the highest resolution attainable. In the past, the optical behavior of accelerators was usually determined for a particular configuration. During the development of the accelerator for the Arizona 1 MEV STEM, systematic investigation was made of the major optical properties for a variety of electrode configurations, number of stages N, accelerating voltages, 1 and 10 MEV, and a range of injection voltages ϕ0 = 1, 3, 10, 30, 100, 300 kV).

Characteristics and Application of Temperature-Field Emitters

1975 ◽  
Vol 33 ◽  
pp. 144-145
Author(s):  
N. Tamura ◽  
T. Goto ◽  
Y. Harada
Keyword(s):  
Temperature Field ◽  
Electron Microscope ◽  
Field Emission ◽  
Resolving Power ◽  
High Brightness ◽  
Field Emitters ◽  
Emission Electron ◽  
Sufficient Stability ◽  
Scanning Electron ◽  
Illuminating System

On account of its high brightness, the field emission electron source has the advantage that it provides the conventional electron microscope with highly coherent illuminating system and that it directly improves the, resolving power of the scanning electron microscope. The present authors have reported some results obtained with a 100 kV field emission electron microscope.It has been proven, furthermore, that the tungsten emitter as a temperature field emission source can be utilized with a sufficient stability under a modest vacuum of 10-8 ~ 10-9 Torr. The present paper is concerned with an extension of our study on the characteristics of the temperature field emitters.

A comparative study on the cold type and thermal type field emission guns used in the same electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 58-59
Author(s):  
M. Iwatsuki ◽  
Y. Kokubo ◽  
Y. Harada
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Signal To Noise Ratio ◽  
Electron Source ◽  
Resolving Power ◽  
Optical Source ◽  
Experimental Conditions ◽  
High Brightness ◽  
Illumination System ◽  
Transmission Electron

On accout of its high brightness, small optical source size, and minimal energy spread, the field emission gun (FEG) has the advantage that it provides the conventional transmission electron microscope (TEM) with a highly coherent illumination system and directly improves the resolving power and signal-to-noise ratio of the scanning electron microscope (SEM). The FEG is generally classified into two types; the cold field emission (C-FEG) and thermal field emission gun (T-FEG). The former, in which a field emitter is used at the room temperature, was successfully developed as an electron source for the SEM. The latter, in which the emitter is heated to the temperature range of 1000-1800°K, was also proved to be very suited as an electron source for the TEM, as well as for the SEM. Some characteristics of the two types of the FEG have been studied and reported by many authors. However, the results of the respective types have been obtained separately under different experimental conditions.

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