scholarly journals Preface to Special Issue on High Stability and High Brightness Laser Using Beam Combining Technique

2016 ◽  
Vol 44 (6) ◽  
pp. 356
Author(s):  
Koji TSUBAKIMOTO
2017 ◽  
Author(s):  
Eric J. Stanton ◽  
Alexander Spott ◽  
Nicolas Volet ◽  
Michael L. Davenport ◽  
John E. Bowers

2020 ◽  
Vol 47 (7) ◽  
pp. 0701021
Author(s):  
张俊 Zhang Jun ◽  
彭航宇 Peng Hangyu ◽  
付喜宏 Fu Xihong ◽  
秦莉 Qin Li ◽  
宁永强 Ning Yongqiang ◽  
...  

2017 ◽  
Vol 9 (2) ◽  
pp. 1-6 ◽  
Author(s):  
Huicheng Meng ◽  
Xu Ruan ◽  
Zhao Wang ◽  
Weichuan Du ◽  
Linhui Guo ◽  
...  

1995 ◽  
Vol 3 (5) ◽  
pp. 10-11
Author(s):  
Damon Heer

Part 1 of this article series (October 1994 issue) covered the performance features of various tip shapes and explained why the <100> crystal orientation is the industry standard. Part 2 (January/February 1995 issue) covered cathode mounting design and explained how the Mini Vogel Mount cathode design provides high-stability and long-lifetime performance.LaB6 and CeB6 cathodes are used as high-brightness, high-stability, longlifetime cathodes in a variety of electron beam applications. A high-brightness source provides small spot sizes for high resolution and improved analytical results from high beam currents.


2010 ◽  
Author(s):  
Aimin Yan ◽  
Liren Liu ◽  
Enwen Dai ◽  
Jianfeng Sun ◽  
Yu Zhou ◽  
...  

1999 ◽  
Vol 563 ◽  
Author(s):  
G. S. Cargill III ◽  
A. C. Ho ◽  
K. J. Hwang ◽  
H. K. Kao ◽  
P.-C. Wang ◽  
...  

AbstractThe interplay between stress and electromigration has been recognized since I. A. Blech et al. used x-ray topography in 1976 to demonstrate that stress gradients developed during electromigration. Availability of high brightness synchrotron x-ray sources, high stability energy dispersive detectors, high resolution area detectors, and pinholes, capillaries and other optical elements for forming x-ray microbeams, has made possible more quantitative, real time measurements of strains and composition changes which develop in polycrystalline metal conductor lines during electromigration. This paper describes advances made in this area, implications of results which have been obtained, and prospects for further progress.


2015 ◽  
Vol 42 (3) ◽  
pp. 0302003 ◽  
Author(s):  
孟慧成 Meng Huicheng ◽  
武德勇 Wu Deyong ◽  
谭昊 Tan Hao ◽  
李建民 Li Jianming ◽  
余俊宏 Yu Junhong ◽  
...  

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