Influence of primary electron energy and take-off angle of scanning electron microscopy on backscattered electron contrast of iron oxide

T. Aoyama; M. Nagoshi; K. Sato

doi:10.1002/sia.5564

Influence of primary electron energy and take-off angle of scanning electron microscopy on backscattered electron contrast of iron oxide

Surface and Interface Analysis ◽

10.1002/sia.5564 ◽

2014 ◽

Vol 46 (12-13) ◽

pp. 1291-1295 ◽

Cited By ~ 5

Author(s):

T. Aoyama ◽

M. Nagoshi ◽

K. Sato

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Iron Oxide ◽

Electron Energy ◽

Primary Electron ◽

Primary Electron Energy ◽

Backscattered Electron ◽

Scanning Electron

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An annular toroidal backscattered electron energy analyser for use in scanning electron microscopy

Scanning ◽

10.1002/sca.4950180804 ◽

2006 ◽

Vol 18 (8) ◽

pp. 556-561 ◽

Cited By ~ 36

Author(s):

E. I. Rau ◽

V. N. E. Robinson

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Energy ◽

Backscattered Electron ◽

Scanning Electron

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Scanning Electron Microscopy with Backscattered Electron Imaging to IdentifyPneumocystis carinii

New England Journal of Medicine ◽

10.1056/nejm198712103172416 ◽

1987 ◽

Vol 317 (24) ◽

pp. 1541-1541 ◽

Cited By ~ 4

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Backscattered Electron Imaging ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

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Identification of Cells by Backscattered Electron Imaging of Silver Stained Bulk Tissues in Scanning Electron Microscopy

Stain Technology ◽

10.3109/10520298409113847 ◽

1984 ◽

Vol 59 (3) ◽

pp. 143-148 ◽

Cited By ~ 3

Author(s):

Tsuyoshi Horiguchi ◽

Fumie Sasaki ◽

Hideki Takahama ◽

Kyozo Watanabe

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Backscattered Electron Imaging ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

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Backscattered electron image of osmium-impregnated/macerated tissues as a novel technique for identifying the cis -face of the Golgi apparatus by high-resolution scanning electron microscopy

Journal of Microscopy ◽

10.1111/jmi.12379 ◽

2016 ◽

Vol 263 (1) ◽

pp. 87-96 ◽

Cited By ~ 5

Author(s):

D. KOGA ◽

H. BOCHIMOTO ◽

T. WATANABE ◽

T. USHIKI

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

High Resolution ◽

Golgi Apparatus ◽

Novel Technique ◽

Electron Image ◽

Backscattered Electron ◽

Scanning Electron

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Backscattered electron detector for 3D microstructure visualization in scanning electron microscopy

Review of Scientific Instruments ◽

10.1063/1.5054746 ◽

2019 ◽

Vol 90 (2) ◽

pp. 023701 ◽

Cited By ~ 2

Author(s):

E. I. Rau ◽

V. Yu. Karaulov ◽

S. V. Zaitsev

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Detector ◽

3D Microstructure ◽

Backscattered Electron ◽

Scanning Electron

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Surface roughness of preparations for backscattered electron-scanning electron microscopy: The image differences and their monte carlo simulation

Scanning ◽

10.1002/sca.4950210601 ◽

2006 ◽

Vol 21 (6) ◽

pp. 361-367 ◽

Cited By ~ 7

Author(s):

P. G. T. Howell ◽

A. Boyde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Surface Roughness ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Backscattered Electron ◽

Scanning Electron

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Increasing compositional backscattered electron contrast in scanning electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2017.12.001 ◽

2018 ◽

Vol 186 ◽

pp. 82-93 ◽

Cited By ~ 5

Author(s):

F. Timischl ◽

N. Inoue

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Backscattered Electron ◽

Scanning Electron

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Fundamental problems of imaging subsurface structures in the backscattered electron mode in scanning electron microscopy

Scanning ◽

10.1002/sca.4950230403 ◽

2006 ◽

Vol 23 (4) ◽

pp. 235-240 ◽

Cited By ~ 14

Author(s):

E. I. Rau ◽

L. Reimer

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Subsurface Structures ◽

Electron Mode ◽

Backscattered Electron ◽

Scanning Electron

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Biological applications of backscattered electron imaging of scanning electron microscopy

Scanning ◽

10.1002/sca.4950090302 ◽

1987 ◽

Vol 9 (3) ◽

pp. 95-98 ◽

Cited By ~ 3

Author(s):

D. Soligo ◽

G. Lambertenghi-Deliliers

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Biological Applications ◽

Backscattered Electron Imaging ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

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In situ investigation of ion-induced dewetting of a thin iron-oxide film on silicon by high resolution scanning electron microscopy

Journal of Applied Physics ◽

10.1063/1.4767068 ◽

2012 ◽

Vol 112 (10) ◽

pp. 103522 ◽

Cited By ~ 3

Author(s):

S. Amirthapandian ◽

F. Schuchart ◽

D. Garmatter ◽

W. Bolse

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Iron Oxide ◽

High Resolution ◽

Oxide Film ◽

In Situ Investigation ◽

Scanning Electron

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