Ga-focused ion beam time-of-flight secondary ion mass spectrometer analysis of the grain boundary segregation/precipitation of boron in steel

2014 ◽  
Vol 46 (5) ◽  
pp. 297-300 ◽  
Author(s):  
Tomohito Tanaka ◽  
Taishi Fujishiro ◽  
Genichi Shigesato ◽  
Shun-ichi Hayashi
Keyword(s):  
Grain Boundary ◽  
Mass Spectrometer ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Time Of Flight ◽  
Boundary Segregation ◽  
Grain Boundary Segregation ◽  
Secondary Ion

State-of-the-Art Three-Dimensional Chemical Characterization of Solid Oxide Fuel Cell Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Tomography

2016 ◽  
Vol 22 (6) ◽  
pp. 1261-1269 ◽  
Author(s):  
Agnieszka Priebe ◽  
Pierre Bleuet ◽  
Gael Goret ◽  
Jerome Laurencin ◽  
Dario Montinaro ◽  
...  
Keyword(s):  
Fuel Cell ◽  
Solid Oxide Fuel Cell ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Time Of Flight ◽  
Porous Electrodes ◽  
Solid Oxide ◽  
Three Dimension ◽  
Oxide Fuel ◽  
Secondary Ion

AbstractIn this paper the potential of time-of-flight secondary ion mass spectroscopy combined with focused ion beam technology to characterize the composition of a solid oxide fuel cell (SOFC) in three-dimension is demonstrated. The very high sensitivity of this method allows even very small amounts of elements/compounds to be detected and localized. Therefore, interlayer diffusion of elements between porous electrodes and presence of pollutants can be analyzed with a spatial resolution of the order of 100 nm. However, proper element recognition and mass interference still remain important issues. Here, we present a complete elemental analysis of the SOFC as well as techniques that help to validate the reliability of obtained results. A discussion on origins of probable artifacts is provided.

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