Traceable thickness determination of organic nanolayers by X-ray reflectometry

2014 ◽  
Vol 46 (10-11) ◽  
pp. 911-914 ◽  
Author(s):  
Jan Wernecke ◽  
Alexander G. Shard ◽  
Michael Krumrey
Keyword(s):  
X Ray ◽  
Thickness Determination

scholarly journals Thickness Determination of Surface Film for Textured Specimens by X-ray Diffraction

1997 ◽  
Vol 30 (1-2) ◽  
pp. 71-79 ◽  
Author(s):  
Liu Yu-Shu ◽  
Zhao Yu
Keyword(s):  
Surface Film ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thickness Determination

A simple and convenient X-ray diffraction method is proposed to determine the thickness of surface film for textured specimens. The analysis result for a synthetic specimen with surface film has proved that the method is applicable and reliable.

Accurate Thickness Determination of Both Thin SiO2on Si and Thin Si on SiO2by Angle-Resolved X-Ray Photoelectron Spectroscopy

1999 ◽  
Vol 38 (Part 1, No. 7A) ◽  
pp. 4172-4179 ◽  
Author(s):  
Toshiharu Katayama ◽  
Hidekazu Yamamoto ◽  
Masahiko Ikeno ◽  
Yoji Mashiko ◽  
Satoru Kawazu ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Thickness Determination

Thickness determination of ultrathin metal films using the X-ray fluorescence technique

1980 ◽  
Vol 67 (2) ◽  
pp. 353-356 ◽  
Author(s):  
D.K. Kaushik ◽  
S.Priyokumar Singh ◽  
Chander Bhan ◽  
S.K. Chattopadhyaya ◽  
N. Nath
Keyword(s):  
Metal Films ◽  
Fluorescence Technique ◽  
X Ray ◽  
Thickness Determination ◽  
Ultrathin Metal Films
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