Imaging surfaces of nano-scale roughness by atomic force microscopy with carbon nanotubes as tips: a comparative study

2011 ◽  
Vol 43 (11) ◽  
pp. 1382-1391 ◽  
Author(s):  
Martin Munz ◽  
Jae-Ho Kim ◽  
Oliver Krause ◽  
Debdulal Roy
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Force Microscopy ◽  
Nano Scale ◽  
Atomic Force ◽  
Scale Roughness

Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface

2003 ◽  
Vol 543 (1-3) ◽  
pp. 57-62 ◽  
Author(s):  
S. Decossas ◽  
L. Patrone ◽  
A.M. Bonnot ◽  
F. Comin ◽  
M. Derivaz ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Nanostructured Surface ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Effects of tip-nanotube interactions on atomic force microscopy imaging of carbon nanotubes

Nano Research ◽  
2012 ◽  
Vol 5 (4) ◽  
pp. 235-247 ◽  
Author(s):  
Rouholla Alizadegan ◽  
Albert D. Liao ◽  
Feng Xiong ◽  
Eric Pop ◽  
K. Jimmy Hsia
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

Atomistic comparative study of VUV photodeposited silicon nitride on InP(100) by simulation and atomic force microscopy

2000 ◽  
Vol 154-155 ◽  
pp. 337-344 ◽  
Author(s):  
J. Flicstein ◽  
E. Guillonneau ◽  
J. Marquez ◽  
L.S. How Kee Chun ◽  
D. Maisonneuve ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Silicon Nitride ◽  
Comparative Study ◽  
Force Microscopy ◽  
Atomic Force
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