Molecular depth profiling of polymers with very low energy reactive ions

2010 ◽  
Vol 42 (8) ◽  
pp. 1402-1408 ◽  
Author(s):  
L. Houssiau ◽  
N. Mine
Keyword(s):  
Depth Profiling ◽  
Low Energy ◽  
Molecular Depth Profiling ◽  
Reactive Ions

Molecular depth profiling of polymers with very low energy ions

2008 ◽  
Vol 255 (4) ◽  
pp. 970-972 ◽  
Author(s):  
L. Houssiau ◽  
B. Douhard ◽  
N. Mine
Keyword(s):  
Depth Profiling ◽  
Low Energy ◽  
Molecular Depth Profiling ◽  
Low Energy Ions

Molecular depth-profiling of polycarbonate with low-energy Cs+ ions

2007 ◽  
Vol 21 (16) ◽  
pp. 2680-2684 ◽  
Author(s):  
Nicolas Mine ◽  
Bastien Douhard ◽  
Jeremy Brison ◽  
Laurent Houssiau
Keyword(s):  
Depth Profiling ◽  
Low Energy ◽  
Molecular Depth Profiling ◽  
Cs Ions

Molecular depth profiling of model biological films using low energy monoatomic ions

2012 ◽  
Vol 321-322 ◽  
pp. 1-7 ◽  
Author(s):  
J. Brison ◽  
N. Mine ◽  
N. Wehbe ◽  
X. Gillon ◽  
T. Tabarrant ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Low Energy ◽  
Molecular Depth Profiling ◽  
Biological Films

scholarly journals Effect of the molecular weight on the depth profiling of PMMA thin films using low‐energy Cs + sputtering

2021 ◽  
Author(s):  
Amal Ben Hadj Mabrouk ◽  
Christophe Licitra ◽  
Antoine Chateauminois ◽  
Marc Veillerot
Keyword(s):  
Thin Films ◽  
Molecular Weight ◽  
Depth Profiling ◽  
Low Energy

Ultra-shallow arsenic implant depth profiling using low-energy nitrogen beams

2004 ◽  
Vol 231-232 ◽  
pp. 645-648 ◽  
Author(s):  
Sarah Fearn ◽  
Richard Chater ◽  
David McPhail
Keyword(s):  
Depth Profiling ◽  
Low Energy

scholarly journals An estimation on the mechanical stabilities of SAMs by low energy Ar+ cluster ion collision

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Y. Tong ◽  
G. R. Berdiyorov ◽  
A. Sinopoli ◽  
M. E. Madjet ◽  
V. A. Esaulov ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Photoelectron Spectroscopy ◽  
Density Functional ◽  
Crystal Surface ◽  
Depth Profiling ◽  
Low Energy ◽  
Cross Linking ◽  
Xps Spectra ◽  
Self Assembled ◽  
The Stability

AbstractThe stability of the molecular self-assembled monolayers (SAMs) is of vital importance to the performance of the molecular electronics and their integration to the future electronics devices. Here we study the effect of electron irradiation-induced cross-linking on the stability of self-assembled monolayer of aromatic 5,5′-bis(mercaptomethyl)-2,2′-bipyridine [BPD; HS-CH2-(C5H3N)2-CH2-SH] on Au (111) single crystal surface. As a refence, we also study the properties of SAMs of electron saturated 1-dodecanethiol [C12; CH3-(CH2)11-SH] molecules. The stability of the considered SAMs before and after electron-irradiation is studied using low energy Ar+ cluster depth profiling monitored by recording the X-ray photoelectron spectroscopy (XPS) core level spectra and the UV-photoelectron spectroscopy (UPS) in the valance band range. The results indicate a stronger mechanical stability of BPD SAMs than the C12 SAMs. The stability of BPD SAMs enhances further after electron irradiation due to intermolecular cross-linking, whereas the electron irradiation results in deterioration of C12 molecules due to the saturated nature of the molecules. The depth profiling time of the cross-linked BPD SAM is more than 4 and 8 times longer than the profiling time obtained for pristine and BPD and C12 SAMs, respectively. The UPS results are supported by density functional theory calculations, which show qualitative agreement with the experiment and enable us to interpret the features in the XPS spectra during the etching process for structural characterization. The obtained results offer helpful options to estimate the structural stability of SAMs which is a key factor for the fabrication of molecular devices.

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