Characterization of NiB amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

S. Diplas; J. Lehrmann; S. Jørgensen; T. Våland; J. F. Watts; J. Taftø

doi:10.1002/sia.2033

Characterization of NiB amorphous alloys with x-ray photoelectron and secondary ion mass spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.2033 ◽

2005 ◽

Vol 37 (5) ◽

pp. 459-465 ◽

Cited By ~ 13

Author(s):

S. Diplas ◽

J. Lehrmann ◽

S. Jørgensen ◽

T. Våland ◽

J. F. Watts ◽

...

Keyword(s):

Mass Spectroscopy ◽

Amorphous Alloys ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Compositional characterization of very thin SiO2/Si3N4/SiO2 stacked films by x-ray photoemission spectroscopy and time-of-flight-secondary-ion-mass spectroscopy techniques

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580730 ◽

1997 ◽

Vol 15 (3) ◽

pp. 905-910 ◽

Cited By ~ 5

Author(s):

S. Santucci ◽

L. Lozzi ◽

L. Ottaviano ◽

M. Passacantando ◽

P. Picozzi ◽

...

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Photoemission Spectroscopy ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion ◽

Compositional Characterization

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Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽

10.3131/jvsj.38.295 ◽

1995 ◽

Vol 38 (3) ◽

pp. 295-298 ◽

Cited By ~ 2

Author(s):

Wen Biao YING ◽

Yusuke MIZOKAWA ◽

Yoshitomo KAMIURA ◽

Yong Bing YU ◽

Masafumi NISHIMATSU ◽

...

Keyword(s):

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Silicon Surfaces ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Doped Silicon ◽

Phosphorus Doped ◽

Secondary Ion

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Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy

Journal of Applied Physics ◽

10.1063/1.368416 ◽

1998 ◽

Vol 84 (5) ◽

pp. 2546-2550 ◽

Cited By ~ 9

Author(s):

S. Senz ◽

U. Egger ◽

M. Schultz ◽

U. Gösele ◽

H. Ito

Keyword(s):

High Resolution ◽

Mass Spectroscopy ◽

X Ray Diffraction ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Comparison of nitrogen compositions in the as-grown GaNxAs1−x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

Applied Physics Letters ◽

10.1063/1.1483913 ◽

2002 ◽

Vol 80 (22) ◽

pp. 4136-4138 ◽

Cited By ~ 63

Author(s):

W. J. Fan ◽

S. F. Yoon ◽

T. K. Ng ◽

S. Z. Wang ◽

W. K. Loke ◽

...

Keyword(s):

High Resolution ◽

Mass Spectroscopy ◽

X Ray Diffraction ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Physical and Chemical Characterization of Beryllium Particles from Several Workplaces in Québec, Canada—Part B: Time-of-flight Secondary-ion Mass Spectroscopy

Journal of Toxicology and Environmental Health Part A ◽

10.1080/15287390500192080 ◽

2005 ◽

Vol 68 (21) ◽

pp. 1907-1916 ◽

Cited By ~ 11

Author(s):

Mathieu Rouleau ◽

Joseph Zayed ◽

Chantal Dion ◽

Philippe Plamondon ◽

Gilles L'Espérance

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Chemical Characterization ◽

Secondary Ion Mass Spectroscopy ◽

Physical And Chemical Characterization ◽

Physical And Chemical ◽

Secondary Ion

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Composition Analysis of High-Stable Transparent Conductive Zinc Oxide by X-ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.121101 ◽

2011 ◽

Vol 50 (12R) ◽

pp. 121101 ◽

Cited By ~ 1

Author(s):

Takashi Kuchiyama ◽

Shigehiko Hasegawa ◽

Kenji Yamamoto ◽

Yuden Teraoka ◽

Hajime Asahi

Keyword(s):

Zinc Oxide ◽

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Composition Analysis ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Study of Asphaltene Adsorption on Kaolinite by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy

Energy & Fuels ◽

10.1021/ef4001314 ◽

2013 ◽

Vol 27 (5) ◽

pp. 2465-2473 ◽

Cited By ~ 32

Author(s):

Shanshan Wang ◽

Qi Liu ◽

Xiaoli Tan ◽

Chunming Xu ◽

Murray R. Gray

Keyword(s):

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Studies of Ion-Selective Solvent Polymeric Membranes by X-ray Photoelectron Spectroscopy and Time-of-Flight Static Secondary Ion Mass Spectroscopy

Analytical Chemistry ◽

10.1021/ac980341j ◽

1998 ◽

Vol 70 (20) ◽

pp. 4241-4246 ◽

Cited By ~ 17

Author(s):

Qingshan Ye ◽

George Horvai ◽

András Tóth ◽

Imre Bertóti ◽

Marc Botreau ◽

...

Keyword(s):

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

Polymeric Membranes ◽

Selective Solvent ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Secondary Ion

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Characterization of Ti diffusion in PVD deposited WTi/AlCu metallization on monocrystalline Si by means of secondary ion mass spectroscopy

Microelectronics Reliability ◽

10.1016/j.microrel.2012.06.066 ◽

2012 ◽

Vol 52 (9-10) ◽

pp. 1993-1997 ◽

Cited By ~ 4

Author(s):

M. Plappert ◽

O. Humbel ◽

A. Koprowski ◽

M. Nowottnick

Keyword(s):

Mass Spectroscopy ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)

Surface Science ◽

10.1016/0039-6028(75)90160-0 ◽

1975 ◽

Vol 53 (1) ◽

pp. 636-648 ◽

Cited By ~ 12

Author(s):

M. Gettings ◽

J.P. Coad

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Pure Metal ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Preliminary Study ◽

Secondary Ion

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