scholarly journals High-Resolution Lithography with Near-Field Optical Microscopy

Scanning ◽  
2006 ◽  
Vol 18 (8) ◽  
pp. 567-571 ◽  
Author(s):  
A. Naber ◽  
H. Kock ◽  
H. Fuchs
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field

scholarly journals Near-Field Scanning Optical Microscopy for High-Resolution Membrane Studies

Nanoimaging ◽  
2012 ◽  
pp. 373-394 ◽  
Author(s):  
Heath A. Huckabay ◽  
Kevin P. Armendariz ◽  
William H. Newhart ◽  
Sarah M. Wildgen ◽  
Robert C. Dunn
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scattering optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides

1998 ◽  
Author(s):  
Roderick S. Taylor ◽  
Kurt E. Leopold ◽  
Jeffrey W. Fraser ◽  
Yan Feng ◽  
Margaret Buchanan
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Infrared ◽  
Near Field ◽  
Infrared Lasers

scholarly journals Revealing nanoscale optical properties and morphology in perfluoropentacene films by confocal and tip-enhanced near-field optical microscopy and spectroscopy

2016 ◽  
Vol 18 (23) ◽  
pp. 15919-15926 ◽  
Author(s):  
Xiao Wang ◽  
Katharina Broch ◽  
Frank Schreiber ◽  
Alfred J. Meixner ◽  
Dai Zhang
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
High Resolution ◽  
Optical Microscopy ◽  
Organic Semiconductor ◽  
Near Field ◽  
Semiconductor Thin Films ◽  
Sensitive Method

Combining confocal and high resolution near-field optical microscopy and spectroscopy, we propose a sensitive method for determining the local morphology in organic semiconductor thin films.

scholarly journals Graphene-based near-field optical microscopy: high-resolution imaging using reconfigurable gratings

2017 ◽  
Vol 56 (11) ◽  
pp. 3132 ◽  
Author(s):  
Sandeep Inampudi ◽  
Jierong Cheng ◽  
Hossein Mosallaei
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field ◽  
High Resolution Imaging ◽  
Resolution Imaging

scholarly journals High-resolution FISH using Scanning Near-field Optical Microscopy

Hyomen Kagaku ◽  
2007 ◽  
Vol 28 (9) ◽  
pp. 536-538 ◽  
Author(s):  
Takeshi YAMAUCHI ◽  
Tomoyuki YOSHINO ◽  
Seigo KUWAZAKI ◽  
Yoshitaka SUETSUGU ◽  
Kimiko YAMAMOTO ◽  
...  
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field

Implications of high resolution to near-field optical microscopy

1998 ◽  
Vol 71 (1-4) ◽  
pp. 341-344 ◽  
Author(s):  
Lukas Novotny ◽  
Bert Hecht ◽  
Dieter W. Pohl
Keyword(s):  
High Resolution ◽  
Optical Microscopy ◽  
Near Field

Prototype of Illumination-Collection Mode Scanning Near-Field Optical Microscopy and Raman Spectroscopy with Gold Inner-Coated Aperture-Less Pyramidal Probe

2010 ◽  
Vol 459 ◽  
pp. 129-133
Author(s):  
Sumio Hosaka ◽  
Hirokazu Koyabu ◽  
Yusuke Aramomi ◽  
Hayato Sone ◽  
You Yin ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Raman Spectrum ◽  
High Resolution ◽  
Stress Distribution ◽  
Optical Microscopy ◽  
Near Field ◽  
Peak Shift ◽  
Raman Peak ◽  
Optical Images ◽  
Raman Peak Shift

We have prototyped illumination-collection mode scanning near-field optical microscopy (SNOM) and near-field Raman spectroscopy (NFRS) with gold inner-covered aperture-less pyramidal probe in order to study the possibility to detect optical images, and Raman spectrum and Raman peak shift for stress distribution in Si device with high resolution of about 10 nm.

scholarly journals High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
D. E. Tranca ◽  
S. G. Stanciu ◽  
R. Hristu ◽  
C. Stoichita ◽  
S. A. M. Tofail ◽  
...  
Keyword(s):  
High Resolution ◽  
Quantitative Determination ◽  
Optical Microscopy ◽  
Dielectric Function ◽  
Near Field
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