Near-field scattering optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides

Author(s):  
Roderick S. Taylor ◽  
Kurt E. Leopold ◽  
Jeffrey W. Fraser ◽  
Yan Feng ◽  
Margaret Buchanan
Nanoimaging ◽  
2012 ◽  
pp. 373-394 ◽  
Author(s):  
Heath A. Huckabay ◽  
Kevin P. Armendariz ◽  
William H. Newhart ◽  
Sarah M. Wildgen ◽  
Robert C. Dunn

2016 ◽  
Vol 18 (23) ◽  
pp. 15919-15926 ◽  
Author(s):  
Xiao Wang ◽  
Katharina Broch ◽  
Frank Schreiber ◽  
Alfred J. Meixner ◽  
Dai Zhang

Combining confocal and high resolution near-field optical microscopy and spectroscopy, we propose a sensitive method for determining the local morphology in organic semiconductor thin films.


2017 ◽  
Vol 56 (11) ◽  
pp. 3132 ◽  
Author(s):  
Sandeep Inampudi ◽  
Jierong Cheng ◽  
Hossein Mosallaei

Scanning ◽  
2006 ◽  
Vol 18 (8) ◽  
pp. 567-571 ◽  
Author(s):  
A. Naber ◽  
H. Kock ◽  
H. Fuchs

Hyomen Kagaku ◽  
2007 ◽  
Vol 28 (9) ◽  
pp. 536-538 ◽  
Author(s):  
Takeshi YAMAUCHI ◽  
Tomoyuki YOSHINO ◽  
Seigo KUWAZAKI ◽  
Yoshitaka SUETSUGU ◽  
Kimiko YAMAMOTO ◽  
...  

1998 ◽  
Vol 71 (1-4) ◽  
pp. 341-344 ◽  
Author(s):  
Lukas Novotny ◽  
Bert Hecht ◽  
Dieter W. Pohl

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