Micro-Raman spectroscopy as a complementary technique to high resolution X-ray diffraction for the characterization of Si1-xGexthin layers

2015 ◽  
Vol 12 (3) ◽  
pp. 304-309 ◽  
Author(s):  
Aurèle Durand ◽  
Denis Rouchon ◽  
Delphine Le-Cunff ◽  
Patrice Gergaud
Keyword(s):  
Raman Spectroscopy ◽  
High Resolution ◽  
X Ray Diffraction ◽  
Complementary Technique ◽  
X Ray ◽  
Micro Raman Spectroscopy

scholarly journals Mineral characterization of soil type ranker formed on serpentines occurring in southern Belgrade environs Bubanj Potok

2012 ◽  
Vol 27 (2) ◽  
pp. 131-136
Author(s):  
Bozidar Cekic ◽  
Valentin Ivanovski ◽  
Aleksandar Djordjevic ◽  
Velimir Aleksic ◽  
Zorica Tomic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Soil Type ◽  
X Ray Diffraction ◽  
X Ray ◽  
Micro Raman Spectroscopy ◽  
Detrital Mineral ◽  
Scanning Electron

The paper addresses the issue of health risk associated with the presence of chrysotile in the soil type ranker formed on massive serpentines occurring in the area of Bubanj Potok, a settlement located in the southern Belgrade environs, Serbia. Characterization of the ranker soil was conducted by scanning electron microscopy, X-ray diffraction, micro-Raman spectroscopy and transmission 57Fe M?ssbauer spectroscopy. Scanning electron microscopy figures showed regular shaped smectite (montmorillonite) particles, aggregates of chlorite, and elongated sheets of serpentines minerals antigorite. X-ray diffraction analysis confirmed the presence of detrital mineral quartz polymorph as well as minor amounts of other mineral species. Micro-Raman spectroscopy identified the presence of dominant minerals, such as montmorillonite, kaolinite, muscovite, gypsum, calcite, albite, amphiboles (hornblende/kaersutite) and orthoclase. Important polymorph silica modifications of quartz, olivine (forsterite), pyroxene (enstatite/ferrosilite, diopside/hedenbergite), and serpentine (antigorite/lizardite/chrysotile) were identified.

scholarly journals Characterization of the distribution, polymorphism, and stability of nimodipine in its solid dispersions in polyethylene glycol by micro-Raman spectroscopy and powder x-ray diffraction

2007 ◽  
Vol 9 (3) ◽  
pp. E361-E370 ◽  
Author(s):  
Aristides Docoslis ◽  
Krista L. Huszarik ◽  
George Z. Papageorgiou ◽  
Dimitrios Bikiaris ◽  
Anagnostis Stergiou ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Polyethylene Glycol ◽  
Solid Dispersions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Micro Raman Spectroscopy

A Novel Route For The Synthesis of LiAlxCo1−xO2 Battery Materials And Their Structural Properties

2000 ◽  
Vol 658 ◽  
Author(s):  
M. S. Tomar ◽  
A. Hidalgo ◽  
P. S. Dobal ◽  
R. S. Katiyar ◽  
A. Dixit ◽  
...  
Keyword(s):  
Phase Diagram ◽  
Raman Spectroscopy ◽  
Rechargeable Batteries ◽  
X Ray Diffraction ◽  
Battery Materials ◽  
X Ray ◽  
Micro Raman Spectroscopy ◽  
Al Substitution ◽  
Constituent Elements

ABSTRACTLiCoO2 is an important cathode material for rechargeable batteries. Al substitution on Co sites was recently found to enhance its intercalation voltage. We have developed a reliable and less expensive method for the synthesis of such LiAlxCo1−xO2 compositions using simple salts of the constituent elements and organic solvents. X-ray diffraction and Raman spectroscopy were used for structural characterization of these materials at various annealing temperatures. The phase evolutions in LiAlxCo1−xO2 compositions were studied using micro-Raman spectroscopy and a phase diagram is proposed based on the observations. The phase diagram suggests that thin films of these materials can be deposited at substrate temperature at about 650°C

Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics

1996 ◽  
Vol 421 ◽  
Author(s):  
J. Wagner ◽  
J. Schmitz ◽  
F. Fuchs ◽  
U. Weimar ◽  
N. Herres ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Structural Characterization ◽  
Molecular Beam ◽  
Alloy Composition ◽  
Structural Quality ◽  
X Ray Diffraction ◽  
X Ray

AbstractWe report on the structural characterization of InAs/(GaIn)Sb superlattices (SL) grown by solid-source molecular-beam epitaxy. SL periodicity and overall structural quality were assessed by high-resolution X-ray diffraction and Raman spectroscopy. Spectroscopic ellipsometry was found to be sensitive to the (GaIn)Sb alloy composition.

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

Deposition of TRISO Particles With Superhard SiC Coatings and the Characterization of Anisotropy by Raman Spectroscopy

2009 ◽  
Vol 131 (4) ◽  
Author(s):  
E. López-Honorato ◽  
P. J. Meadows ◽  
J. Tan ◽  
Y. Xiang ◽  
P. Xiao
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
Pyrolytic Carbon ◽  
X Ray Diffraction ◽  
X Ray ◽  
Flat Substrate ◽  
High Concentrations ◽  
Triso Particles ◽  
Sic Coatings

In this work we have deposited silicon carbide (SiC) at 1300°C with the addition of small amounts of propylene. The use of propylene and high concentrations of methyltrichlorosilane (9 vol %) allowed the deposition of superhard SiC coatings (42 GPa). The superhard SiC could result from the presence of a SiC–C solid solution, undetectable by X-ray diffraction but visible by Raman spectroscopy. Another sample obtained by the use of 50 vol % Argon, also showed the formation of SiC with good properties. The use of a flat substrate together with the particles showed the importance of carrying out the analysis on actual particles rather than in flat substrates. We show that it is possible to characterize the anisotropy of pyrolytic carbon by Raman spectroscopy.

High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs Mqw Structures

1997 ◽  
pp. 439-448 ◽  
Author(s):  
A. Sanz-Hervás ◽  
C. Villar ◽  
M. Aguilar ◽  
A. Sacedón ◽  
J. L. Sánchez-Rojas ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray Diffraction ◽  
X Ray
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