Deposition of TRISO Particles With Superhard SiC Coatings and the Characterization of Anisotropy by Raman Spectroscopy

2009 ◽  
Vol 131 (4) ◽  
Author(s):  
E. López-Honorato ◽  
P. J. Meadows ◽  
J. Tan ◽  
Y. Xiang ◽  
P. Xiao
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
Pyrolytic Carbon ◽  
X Ray Diffraction ◽  
X Ray ◽  
Flat Substrate ◽  
High Concentrations ◽  
Triso Particles ◽  
Sic Coatings

In this work we have deposited silicon carbide (SiC) at 1300°C with the addition of small amounts of propylene. The use of propylene and high concentrations of methyltrichlorosilane (9 vol %) allowed the deposition of superhard SiC coatings (42 GPa). The superhard SiC could result from the presence of a SiC–C solid solution, undetectable by X-ray diffraction but visible by Raman spectroscopy. Another sample obtained by the use of 50 vol % Argon, also showed the formation of SiC with good properties. The use of a flat substrate together with the particles showed the importance of carrying out the analysis on actual particles rather than in flat substrates. We show that it is possible to characterize the anisotropy of pyrolytic carbon by Raman spectroscopy.

Deposition of TRISO Particles With Superhard SiC Coatings and the Characterization of Anisotropy by Raman Spectroscopy

2008 ◽  
Author(s):  
Eddie Lo´pez-Honorato ◽  
Philippa J. Meadows ◽  
Jun Tan ◽  
Yang Xiang ◽  
Ping Xiao
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Flat Substrate ◽  
High Concentrations ◽  
Triso Particles ◽  
Sic Coatings

In this work we have deposited SiC at 1300°C with the addition of small amounts of propylene. The use of propylene and high concentrations of methyltrichlorosilane (9 vol%) allowed the deposition of superhard SiC coatings (42 GPa). The superhard SiC could result from the presence of a SiC-C solid solution, undetectable by X-ray diffraction but visible by Raman spectroscopy. Another sample obtained by the use of 50 vol% Argon, also showed the formation of SiC with good properties. The use of a flat substrate together with the particles showed the importance of carrying out the analysis on actual particles rather than in flat substrates. We show that it is possible to characterize the anisotropy of PyC by Raman spectroscopy.

scholarly journals Structural and Raman Vibrational Studies ofCeO2-Bi2O3Oxide System

2009 ◽  
Vol 2009 ◽  
pp. 1-4 ◽  
Author(s):  
L. Bourja ◽  
B. Bakiz ◽  
A. Benlhachemi ◽  
M. Ezahri ◽  
J. C. Valmalette ◽  
...  
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
Phase Changes ◽  
Phase System ◽  
X Ray Diffraction ◽  
X Ray ◽  
Vibrational Studies ◽  
Coprecipitation Route

A series of ceramics samples belonging to theCeO2-Bi2O3phase system have been prepared via a coprecipitation route. The crystallized phases were obtained by heating the solid precursors at600∘Cfor 6 hours, then quenching the samples. X-ray diffraction analyses show that forx<0.20a solid solutionCe1−xBixO2−x/2with fluorine structure is formed. For x ranging between 0.25 and 0.7, a tetragonalβ′phase coexisting with the FCC solid solution is observed. For x ranging between 0.8 and 0.9, a new tetragonalβphase appears. Theβ′phase is postulated to be a superstructure of theβphase. Finally, close tox=1, the classical monoclinicα Bi2O3structure is observed. Raman spectroscopy confirms the existence of the phase changes as x varies between 0 and 1.

Thermal Silicidation of Ni/SiGe and Characterization of Resulting Silicide Films Using Raman Spectroscopy and X-ray Diffraction

2020 ◽  
Vol 98 (5) ◽  
pp. 457-464
Author(s):  
Woo Sik Yoo ◽  
Kitaek Kang ◽  
Toshikazu Ishigaki ◽  
Jung Gon Kim ◽  
Noriyuki Hasuike ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray

ERRATA: "CHARACTERIZATION OF POTASSIUM DOPED GdBa2Cu3O7-δ USING RAMAN SPECTROSCOPY AND X-RAY DIFFRACTION"

1996 ◽  
Vol 10 (23) ◽  
pp. 1159-1159
Author(s):  
THOMAS PREETHI CICILY ◽  
K. MANOJ KUMAR ◽  
NAYAR V. UNNIKRISHANAN ◽  
V. VIDYALAL ◽  
C.P.G. VALLABHAN
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray

On X-Ray Diffraction and X-Ray Absorption Spectroscopy Characterization of Ball Milled Iron Copper Solid Solution

1998 ◽  
Vol 269-272 ◽  
pp. 473-478 ◽  
Author(s):  
Francsco Cardellini ◽  
Vittoria Contini ◽  
Gregorio D'Agostino ◽  
Adriano Filipponi
Keyword(s):  
Solid Solution ◽  
Absorption Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Iron Copper ◽  
X Ray Absorption

X-ray powder diffraction characterization of Bi14(Sr,Ca)12O33 solid solutions

1996 ◽  
Vol 11 (4) ◽  
pp. 268-275 ◽  
Author(s):  
Winnie Wong-Ng ◽  
F. Jiang ◽  
Bryan R. Jarabek ◽  
Gregory J. McCarthy
Keyword(s):  
Solid Solution ◽  
Powder Diffraction ◽  
Solid Solutions ◽  
Cell Parameter ◽  
X Ray Diffraction ◽  
Powder Diffraction File ◽  
X Ray ◽  
Solid Solution Range

Powder X-ray diffraction was used to investigate the solid solution range of the Bi14SrxCa12−xO33 series in the Bi–Sr–Ca–O system. Solid solution forms over the range 1≤x≤7 in Bi14SrxCa12−xO33. Experimental X-ray reference patterns of selected members with x=1, 3, 5, and 7 have been prepared for the powder diffraction file (PDF). These phases are monoclinic, C2/m, with cell parameter a ranging from 21.473(4) to 21.868(4) Å, b from 4.3564(9) to 4.3898(9) Å, c from 12.753(2) to 12.962(2) Å, β from 102.91(2)° to 102.79(1)°, and V from 1162.9(3) to 1213.5(3) Å3, respectively. These parameters increase monotonically as Ca is continuously replaced by the larger Sr.

Characterization of CdCrTe Layers Obtained by Pulsed Laser Deposition

2013 ◽  
Vol 203-204 ◽  
pp. 193-197
Author(s):  
Piotr Sagan ◽  
Volodymyr Popovych ◽  
Mariusz Bester ◽  
Marian Kuzma
Keyword(s):  
Solid Solution ◽  
Electron Diffraction ◽  
Lattice Constant ◽  
Pulse Length ◽  
Pulsed Laser ◽  
Thin Layers ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray

In this paper we have obtained CdCrTe thin layers by PLD method using the YAG:Nd3+ laser with pulse length 250μs. Synthesized CdCrTe solid solution with 50% at. of Cr has been taken as a target. The layers were deposited on KCl substrate. The target and films were analyzed using X-ray diffraction, TEM microscope and THEED electron diffraction. The morphology of the layers are homogenous. However, we have detected several crystallographic phases: cubic CdTe, hexagonal Cr and hexagonal Te. From the measurements of lattice constant of the layer, their composition was determined to be x=0,14

Sign in / Sign up

Export Citation Format

Share Document