Use of focused ion beam sample preparation for Auger analysis

2007 ◽  
Vol 4 (6) ◽  
pp. 1859-1866 ◽  
Author(s):  
U. Scheithauer
1993 ◽  
Vol 21 (1-4) ◽  
pp. 375-378 ◽  
Author(s):  
L. Frey ◽  
W. Ergele ◽  
T. Falter ◽  
L. Gong ◽  
H. Ryssel

2017 ◽  
Vol 197 (2) ◽  
pp. 73-82 ◽  
Author(s):  
Miroslava Schaffer ◽  
Julia Mahamid ◽  
Benjamin D. Engel ◽  
Tim Laugks ◽  
Wolfgang Baumeister ◽  
...  

2016 ◽  
Vol 110 (4) ◽  
pp. 860-869 ◽  
Author(s):  
Jan Arnold ◽  
Julia Mahamid ◽  
Vladan Lucic ◽  
Alex de Marco ◽  
Jose-Jesus Fernandez ◽  
...  

2005 ◽  
Vol 11 (S02) ◽  
Author(s):  
P E Russell ◽  
K L Bunker ◽  
R Garcia ◽  
T J Stark ◽  
J P Vitarelli

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