Porous silicon antireflection layer for solar cells using metal-assisted chemical etching

2008 ◽  
Vol 205 (7) ◽  
pp. 1724-1728 ◽  
Author(s):  
Rachid Chaoui ◽  
Bedra Mahmoudi ◽  
Yasmina Si Ahmed
2013 ◽  
Author(s):  
Igor Iatsunskyi ◽  
Valentyn Smyntyna ◽  
Mykolai Pavlenko ◽  
Olga Kanevska ◽  
Yuliia Kirik ◽  
...  

Small ◽  
2016 ◽  
Vol 13 (3) ◽  
pp. 1602739 ◽  
Author(s):  
Nancy Wareing ◽  
Kyle Szymanski ◽  
Giridhar R. Akkaraju ◽  
Armando Loni ◽  
Leigh T. Canham ◽  
...  

2014 ◽  
Vol 14 (12) ◽  
pp. 9224-9231 ◽  
Author(s):  
Bhaskar Parida ◽  
Jaeho Choi ◽  
Gyoungho Lim ◽  
Seungil Park ◽  
Keunjoo Kim

ACS Omega ◽  
2018 ◽  
Vol 3 (9) ◽  
pp. 10898-10906 ◽  
Author(s):  
Ioannis Leontis ◽  
Martha A. Botzakaki ◽  
Stavroula N. Georga ◽  
A. Galiouna Nassiopoulou

ISRN Optics ◽  
2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Igor Iatsunskyi ◽  
Valentin Smyntyna ◽  
Nykolai Pavlenko ◽  
Olga Sviridova

Photoluminescent (PL) porous layers were formed on p-type silicon by a metal-assisted chemical etching method using H2O2 as an oxidizing agent. Silver particles were deposited on the (100) Si surface prior to immersion in a solution of HF and H2O2. The morphology of the porous silicon (PS) layer formed by this method was investigated by atomic force microscopy (AFM). Depending on the metal-assisted chemical etching conditions, the macro- or microporous structures could be formed. Luminescence from metal-assisted chemically etched layers was measured. It was found that the PL intensity increases with increasing etching time. This behaviour is attributed to increase of the density of the silicon nanostructure. It was found the shift of PL peak to a green region with increasing of deposition time can be attributed to the change in porous morphology. Finally, the PL spectra of samples formed by high concentrated solution of AgNO3 showed two narrow peaks of emission at 520 and 550 nm. These peaks can be attributed to formation of AgF and AgF2 on a silicon surface.


2003 ◽  
Vol 5 (8) ◽  
pp. 632-636 ◽  
Author(s):  
Shinji Yae ◽  
Yukinori Kawamoto ◽  
Hiroyuki Tanaka ◽  
Naoki Fukumuro ◽  
Hitoshi Matsuda

2012 ◽  
Vol 1408 ◽  
Author(s):  
Alexander A. Tonkikh ◽  
Nadine Geyer ◽  
Bodo Fuhrmann ◽  
Hartmut S. Leipner ◽  
Peter Werner

ABSTRACTThe selective formation of porous silicon in nanowires is observed in Si/Ge epitaxial layers along Ge layers grown by molecular beam epitaxy on a Si(100) substrate after metal-assisted chemical etching in aqueous HF-H2O2 solution. We assume that Ge layers serve as channels for a hole current out of the semiconductor to sustain the dissolution reaction. The tunnelling of holes through the potential barrier at the semiconductor surface is assumed to be the dominating mechanism of the hole transfer to the electrolyte.


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