Influence of molecular weight on the short-channel effect in polymer-based field-effect transistors

2011 ◽  
Vol 50 (2) ◽  
pp. 117-124 ◽  
Author(s):  
Ali Veysel Tunc ◽  
Bernhard Ecker ◽  
Zekeriya Dogruyol ◽  
Sabrina Jüchter ◽  
Ahmet Lütfi Ugur ◽  
...  
Keyword(s):  
Molecular Weight ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Short Channel ◽  
Short Channel Effect ◽  
Channel Effect

Improved Subthreshold Swing and Short Channel Effect in FDSOI n-Channel Negative Capacitance Field Effect Transistors

2018 ◽  
Vol 39 (2) ◽  
pp. 300-303 ◽  
Author(s):  
Daewoong Kwon ◽  
Korok Chatterjee ◽  
Ava J. Tan ◽  
Ajay K. Yadav ◽  
Hong Zhou ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Subthreshold Swing ◽  
Negative Capacitance ◽  
Short Channel ◽  
Short Channel Effect ◽  
Channel Effect

Analysis of an Anomalous Transistor Exhibiting Dual-Vt Characteristics and Its Cause in a 90nm Node CMOS Technology

2012 ◽  
Author(s):  
Yuk L. Tsang ◽  
Xiang D. Wang ◽  
Reyhan Ricklefs ◽  
Jason Goertz
Keyword(s):  
Threshold Voltage ◽  
Electrical Characterization ◽  
Cmos Technology ◽  
Short Channel ◽  
Visual Defect ◽  
Subthreshold Region ◽  
Short Channel Effect ◽  
Channel Effect ◽  
Transistor Model

Abstract In this paper, we report a transistor model that has successfully led to the identification of a non visual defect. This model was based on detailed electrical characterization of a MOS NFET exhibiting a threshold voltage (Vt) of just about 40mv lower than normal. This small Vt delta was based on standard graphical extrapolation method in the usual linear Id-Vg plots. We observed, using a semilog plot, two slopes in the Id-Vg curves with Vt delta magnified significantly in the subthreshold region. The two slopes were attributed to two transistors in parallel with different Vts. We further found that one of the parallel transistors had short channel effect due to a punch-through mechanism. It was proposed and ultimately confirmed the cause was due to a dopant defect using scanning capacitance microscopy (SCM) technique.

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