Synthesis and characterization of a novel ambipolar polymer semiconductor based on a fumaronitrile core as an electron-withdrawing group

2012 ◽  
Vol 51 (5) ◽  
pp. 1029-1039 ◽  
Author(s):  
Hyung-Gu Jeong ◽  
Dongyoon Khim ◽  
Eunhwan Jung ◽  
Jin-Mun Yun ◽  
Juhwan Kim ◽  
...  
Keyword(s):  
Synthesis And Characterization ◽  
Polymer Semiconductor ◽  
Electron Withdrawing Group

Synthesis and Characterization of Semiconductor Nanop Articulates

1994 ◽  
Vol 346 ◽  
Author(s):  
Norman Herron ◽  
Ying Wang
Keyword(s):  
Optical Properties ◽  
Molecular Species ◽  
Synthesis And Characterization ◽  
Structural Topology ◽  
Thermal Transformations ◽  
Bulk Materials ◽  
Single Crystal Diffraction ◽  
Polymer Semiconductor ◽  
Synthetic Approaches

ABSTRACTSemiconductor nanoparticulates are important materials bridging the gap in size and electronic properties between molecular species and bulk materials. Synthetic approaches to producing controlled sized clusters of this sort will be described, covering physical encapsulation in zeolites or porous glass and extending to discrete syntheses using surface terminating reagents. The optical properties of the resultant materials will be described in detail and the structural topology of the clusters elucidated by combined powder and single crystal diffraction. Thermal transformations of these clusters into bulk materials will be tracked and the processing possibilities explored for the production of polycrystalline films and polymer/semiconductor composites. Photoconductivity in the latter composites will be described.

Synthesis and Characterization of the Three Dicyclopentapyrenes

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula
Keyword(s):  
Synthesis And Characterization

Synthesis and characterization of TiN / Ti / AISI 410 coatings

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama
Keyword(s):  
Synthesis And Characterization ◽  
Photoemission Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Columnar Grains ◽  
Tin Thin Films ◽  
Steel Aisi ◽  
Interacting Surfaces ◽  
Stainless Steel Aisi

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.

Sign in / Sign up

Export Citation Format

Share Document