Modification in structure of La and Nd co-doped epitaxial BiFeO3 thin films probed by micro Raman spectroscopy

2015 ◽  
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pp. 636-643 ◽  
Author(s):  
Anju Ahlawat ◽  
S. Satapathy ◽  
V. G. Sathe ◽  
R. J. Choudhary ◽  
M. K. Singh ◽  
...  
1997 ◽  
Vol 7 (2) ◽  
pp. 3658-3661 ◽  
Author(s):  
D. Chamberlain ◽  
J.P. Sydow ◽  
R.A. Buhrman ◽  
B.H. Moeckly ◽  
K. Char

2015 ◽  
Vol 51 (5) ◽  
pp. 2283-2291 ◽  
Author(s):  
G. Rojas-George ◽  
A. Concha-Balderrama ◽  
H. Esparza-Ponce ◽  
J. Silva ◽  
J. T. Elizalde Galindo ◽  
...  

2015 ◽  
Vol 621 ◽  
pp. 339-344 ◽  
Author(s):  
S.S. Rajput ◽  
R. Katoch ◽  
K.K. Sahoo ◽  
G.N. Sharma ◽  
S.K. Singh ◽  
...  

2011 ◽  
Vol 61 (4) ◽  
pp. 391-397
Author(s):  
Eun Sun KIM ◽  
Jin Won KIM ◽  
Dalhyun DO ◽  
Sang Su KIM*

2000 ◽  
Vol 615 ◽  
Author(s):  
Ingrid De Wolf

ABSTRACTIn this paper, the different applications of Raman spectroscopy for the study of thin films is briefly discussed, using examples from microelectronics. Special attention is given to the application of micro-Raman spectroscopy for the measurement of local stress in and near films.


ACS Omega ◽  
2020 ◽  
Vol 5 (14) ◽  
pp. 8090-8096
Author(s):  
Qiu Li ◽  
Yong Wang ◽  
Tiantian Li ◽  
Wei Li ◽  
Feifan Wang ◽  
...  

2020 ◽  
Vol 698 ◽  
pp. 137852 ◽  
Author(s):  
Junying Zhang ◽  
Peipei Ma ◽  
Taijing Shi ◽  
Xiaohong Shao

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