Site-specific Surface Chemistry on Nanotubes

2010 ◽  
Vol 50 (4) ◽  
pp. 449-452 ◽  
Author(s):  
U. Burghaus ◽  
A. Zak ◽  
R. Rosentsveig
Keyword(s):  
Surface Chemistry ◽  
Specific Surface ◽  
Site Specific

scholarly journals Targeted classification of metal–organic frameworks in the Cambridge structural database (CSD)

2020 ◽  
Vol 11 (32) ◽  
pp. 8373-8387 ◽  
Author(s):  
Peyman Z. Moghadam ◽  
Aurelia Li ◽  
Xiao-Wei Liu ◽  
Rocio Bueno-Perez ◽  
Shu-Dong Wang ◽  
...  
Keyword(s):  
Surface Chemistry ◽  
Specific Surface ◽  
Large Scale ◽  
Metal Cluster ◽  
Metal Organic Frameworks ◽  
Cambridge Structural Database ◽  
Metal Organic ◽  
Structural Database

Large-scale targeted exploration of metal–organic frameworks (MOFs) with characteristics such as specific surface chemistry or metal-cluster family has not been investigated so far.

Site-Specific Surface Functionalization via Microchannel Cantilever Spotting (µCS): Comparison between Azide-Alkyne and Thiol-Alkyne Click Chemistry Reactions

Small ◽  
2018 ◽  
Vol 14 (21) ◽  
pp. 1800131 ◽  
Author(s):  
Seyed Mohammad Mahdi Dadfar ◽  
Sylwia Sekula-Neuner ◽  
Uwe Bog ◽  
Vanessa Trouillet ◽  
Michael Hirtz
Keyword(s):  
Specific Surface ◽  
Click Chemistry ◽  
Surface Functionalization ◽  
Site Specific

Surface Defect Analysis by Using a Novel Backside XTEM Sample Preparation Method

2006 ◽  
Author(s):  
Jian-Shing Luo ◽  
Lang-Yu Huang ◽  
Wen-Lon Gu ◽  
Jeremy D. Russell
Keyword(s):  
Sample Preparation ◽  
Specific Surface ◽  
Surface Defect ◽  
Surface Defects ◽  
Preparation Method ◽  
Defect Analysis ◽  
Sample Preparation Method ◽  
Tem Analysis ◽  
Site Specific ◽  
Electron Spectrometry

Abstract This paper demonstrates a novel method of XTEM sample preparation for site-specific surface defect analysis using backside polishing. Analysis of three different types of site-specific surface defects was demonstrated using a novel backside XTEM sample preparation method. The details of the backside XTEM sample preparation method and some examples are reported in this paper. Comparing to Auger electron spectrometry (AES) results on similar defects, more detailed and precise information is observed using TEM analysis with this method. It is therefore a complementary technique to traditional AES analysis on surface defects for contamination with atomic level concentration. From the results, the sample preparation method can produce a clean, pristine surface that is well characterized and could be reproduced, successfully.

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