ChemInform Abstract: ELECTRICAL PROPERTIES OF THE SEMICONDUCTOR MATERIALS MOLYBDENUM AND TUNGSTEN TRIOXIDES

1983 ◽  
Vol 14 (42) ◽  
Author(s):  
A. A. HANNA ◽  
M. A. KHILLA
Keyword(s):  
Electrical Properties ◽  
Semiconductor Materials ◽  
Tungsten Trioxides ◽  
And Tungsten

Properties of Electrical Conductivity of Amorphous Tungsten-Doped Vanadium Oxide for Uncooled Microbolometers

2007 ◽  
Vol 124-126 ◽  
pp. 343-346 ◽  
Author(s):  
Yong Hee Han ◽  
Seung Hoon Lee ◽  
Kun Tae Kim ◽  
In Hoon Choi ◽  
Sung Moon
Keyword(s):  
Electrical Conductivity ◽  
Electronic Structure ◽  
Electrical Properties ◽  
Vanadium Oxide ◽  
Tungsten Oxide ◽  
Uncooled Microbolometer ◽  
Thermometric Material ◽  
Very High ◽  
And Tungsten

In recent years, we have reported uncooled microbolometer with amorphous vanadium-tungsten oxide as a thermometric material. The reported tungsten-doped vanadium oxide showed very high TCR over -3.0%/K compared with common vanadium oxide, which generally has the TCR values near -2.0%/K. In this work, we characterized properties of electrical conductivity of amorphous tungsten-doped vanadium oxide by investigating electronic structure between vanadium oxide and tungsten-doped vanadium oxide. Finally, it is concluded that tungsten addition into vanadium give rise to changes of electronic structure when pure vanadium is oxidized and this changes of electronic structure attribute to electrical properties such as high TCR values of vanadium-tungsten oxide.

Heat Capacities and Entropies of Molybdenum and Tungsten Trioxides

1943 ◽  
Vol 65 (4) ◽  
pp. 600-602 ◽  
Author(s):  
Harry Seltz ◽  
F. J. Dunkerley ◽  
B. J. DeWitt
Keyword(s):  
Heat Capacities ◽  
Tungsten Trioxides ◽  
And Tungsten

Intelligent Four-Probe Resistivity Meter Based on MCU

2014 ◽  
Vol 644-650 ◽  
pp. 3552-3555
Author(s):  
Jian Zhen Huo
Keyword(s):  
Electrical Properties ◽  
Power Consumption ◽  
Low Power ◽  
Doping Concentration ◽  
Probe Measurement ◽  
Modular Structure ◽  
Semiconductor Materials ◽  
Low Power Consumption ◽  
Resistivity Meter ◽  
Micro Controller Unit

Resistivity is an important parameter to determine the electrical properties of semiconductor materials, which can be obtained from four-probe measurement to get the doping concentration and other important information. This paper gives an introduction of an intelligent DC four-probe meter based on Micro-Controller Unit (MCU), including the principle, the overall framework and the function of each module. The design of hardware and software of the system are described. This instrument has the advantages of miniature size, modular structure, strong anti-interference ability and low power consumption.

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