ChemInform Abstract: PHOTOELECTROCHEMICAL PROPERTIES OF SINGLE-CRYSTAL STRONTIUM TITANATE(IV) DOPED IN THE SURFACE REGION

1982 ◽  
Vol 13 (25) ◽  
Author(s):  
I. WATANABE ◽  
Y. MATSUMOTO ◽  
E. SATO
Crystals ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 693
Author(s):  
Christian Ludt ◽  
Elena Ovchinnikova ◽  
Anton Kulikov ◽  
Dmitri Novikov ◽  
Sibylle Gemming ◽  
...  

This work focuses on the validation of a possible connection of the known Ruddlesden-Popper (RP) phases and the novel concept of the migration-induced field-stabilized polar (MFP) phase. To study this subject, model structures of RP phases in bulk strontium titanate are analyzed by means of density functional theory (DFT). The obtained geometries are compared to experimental MFP data. Good agreement can be found concerning atomic displacements in the pm range and lattice strain inferred by the RP phases. Looking at the energy point of view, the defect structures are on the convex hull of the Gibb’s free energy. Although the dynamics to form the discussed defect models are not addressed in detail, the interplay and stability of the described defect model will add to the possible structure scenarios within the near-surface region of strontium titanate. As a result, it can be suggested that RP phases generally favor the MFP formation.


2020 ◽  
Vol MA2020-02 (27) ◽  
pp. 1907-1907
Author(s):  
Shigeru Ikeda ◽  
Wakaba Fujita ◽  
Yoshitaro Nose ◽  
Ryoji Katsube ◽  
Kenji Yoshino ◽  
...  

2000 ◽  
Vol 28 (1-4) ◽  
pp. 193-200
Author(s):  
A. T. Findikoglu ◽  
Q. X. Jia ◽  
D. W. Reagor ◽  
C. Kwon ◽  
K. O. Rasmussen

1999 ◽  
Vol 572 ◽  
Author(s):  
H. M. Liaw ◽  
S. Q. Hong ◽  
P. Fejes ◽  
D. Werho ◽  
H. Tompkins ◽  
...  

ABSTRACTWe have obtained single-crystal 3C-SiC films via conversion of the surface region of Si (111) and (100) wafers at 970 °C by reaction with C2H4 in an MBE reactor. The major defects in the films were clusters, voids, and misfit dislocations. Investigation by high resolution TEM images showed low lattice strains in the epitaxial layer due to the formation of 1 misfit dislocation for every 4 to 5 regular SiC planes that are bonded to Si at the interface. The clusters and voids often occurred in pairs. A model for forming the void-cluster pairs is suggested.


1967 ◽  
Vol 155 (3) ◽  
pp. 1019-1028 ◽  
Author(s):  
G. Rupprecht ◽  
W. H. Winter

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