scholarly journals Active Nanophotonics: Surface Polariton‐Like s‐Polarized Waveguide Modes in Switchable Dielectric Thin Films on Polar Crystals (Advanced Optical Materials 5/2020)

2020 ◽  
Vol 8 (5) ◽  
pp. 2070018 ◽  
Author(s):  
Nikolai Christian Passler ◽  
Andreas Heßler ◽  
Matthias Wuttig ◽  
Thomas Taubner ◽  
Alexander Paarmann
Keyword(s):  
Thin Films ◽  
Optical Materials ◽  
Surface Polariton ◽  
Dielectric Thin Films ◽  
Polar Crystals ◽  
Waveguide Modes

scholarly journals Surface Polariton‐Like s‐Polarized Waveguide Modes in Switchable Dielectric Thin Films on Polar Crystals

2019 ◽  
Vol 8 (5) ◽  
pp. 1901056 ◽  
Author(s):  
Nikolai Christian Passler ◽  
Andreas Heßler ◽  
Matthias Wuttig ◽  
Thomas Taubner ◽  
Alexander Paarmann
Keyword(s):  
Thin Films ◽  
Surface Polariton ◽  
Dielectric Thin Films ◽  
Polar Crystals ◽  
Waveguide Modes

Finite-Element Modeling and Quantitative Measurement Using Scanning Microwave Microscopy to Characterize Dielectric Films

2018 ◽  
Author(s):  
K. A. Rubin ◽  
W. Jolley ◽  
Y. Yang
Keyword(s):  
Thin Films ◽  
Dielectric Film ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Silicon Substrates ◽  
Fem Modeling ◽  
Dielectric Thin Films ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Low K

Abstract Scanning Microwave Impedance Microscopy (sMIM) can be used to characterize dielectric thin films and to quantitatively discern film thickness differences. FEM modeling of the sMIM response provides understanding of how to connect the measured sMIM signals to the underlying properties of the dielectric film and its substrate. Modeling shows that sMIM can be used to characterize a range of dielectric film thicknesses spanning both low-k and medium-k dielectric constants. A model system consisting of SiO2 thin films of various thickness on silicon substrates is used to illustrate the technique experimentally.

Tunable microwave mixing in nonlinear dielectric thin films of SrTiO3 and Sr0.5Ba0.5TiO3

1995 ◽  
Vol 31 (21) ◽  
pp. 1814-1815 ◽  
Author(s):  
A.T. Findikoglu ◽  
D.W. Reagor ◽  
Q.X. Jia ◽  
X.D. Wu
Keyword(s):  
Thin Films ◽  
Dielectric Thin Films ◽  
Nonlinear Dielectric ◽  
Tunable Microwave

Study of optical parameters of Sulphur doped Se-As thin films as optical materials

Optik ◽  
2021 ◽  
pp. 167447
Author(s):  
Anjani Kumar ◽  
R.K. Shukla ◽  
Rajeev Gupta
Keyword(s):  
Thin Films ◽  
Optical Materials ◽  
Optical Parameters

scholarly journals Reconfigurable Flat Optics with Programmable Reflection Amplitude Using Lithography‐Free Phase‐Change Material Ultra‐Thin Films (Advanced Optical Materials 2/2021)

2021 ◽  
Vol 9 (2) ◽  
pp. 2170006
Author(s):  
Sébastien Cueff ◽  
Arnaud Taute ◽  
Antoine Bourgade ◽  
Julien Lumeau ◽  
Stephane Monfray ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Change ◽  
Phase Change Material ◽  
Optical Materials ◽  
Reflection Amplitude ◽  
Change Material

Sol-gel derived TiNb2 O7 dielectric thin films for transparent electronic applications

2017 ◽  
Vol 101 (2) ◽  
pp. 674-682 ◽  
Author(s):  
Ming-Chuan Chang ◽  
Chieh-Szu Huang ◽  
Yi-Da Ho ◽  
Cheng-Liang Huang
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Dielectric Thin Films

Laser evaporation deposition of superconducting and dielectric thin films

1988 ◽  
Vol 52 (21) ◽  
pp. 1825-1827 ◽  
Author(s):  
H. S. Kwok ◽  
P. Mattocks ◽  
L. Shi ◽  
X. W. Wang ◽  
S. Witanachchi ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Evaporation ◽  
Dielectric Thin Films
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