scholarly journals Hot-Electron Nanoscopy: Experimental Route to Scanning Probe Hot-Electron Nanoscopy (HENs) Applied to 2D Material (Advanced Optical Materials 15/2017)

2017 ◽  
Vol 5 (15) ◽  
Author(s):  
Andrea Giugni ◽  
Bruno Torre ◽  
Marco Allione ◽  
Gobind Das ◽  
Zhenwei Wang ◽  
...  
Keyword(s):  
Optical Materials ◽  
Scanning Probe ◽  
Hot Electron ◽  
2D Material

scholarly journals Experimental Route to Scanning Probe Hot-Electron Nanoscopy (HENs) Applied to 2D Material

2017 ◽  
Vol 5 (15) ◽  
pp. 1700195 ◽  
Author(s):  
Andrea Giugni ◽  
Bruno Torre ◽  
Marco Allione ◽  
Gobind Das ◽  
Zhenwei Wang ◽  
...  
Keyword(s):  
Scanning Probe ◽  
Hot Electron ◽  
2D Material

Conductance switching behavior of GeTe/Sb2Te3 superlattice upon hot-electron injection: a scanning probe microscopy study

MRS Advances ◽  
2016 ◽  
Vol 1 (5) ◽  
pp. 375-380
Author(s):  
Leonid Bolotov ◽  
Yuta Saito ◽  
Tetsuya Tada ◽  
Junji Tominaga
Keyword(s):  
Practical Interest ◽  
Electron Injection ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Switching Behavior ◽  
Hot Electron ◽  
Conductance Switching ◽  
Hot Electron Injection ◽  
Probe Microscope ◽  
Memory Applications

ABSTRACTTopological (GeTe)/(Sb2Te3) superlattices (SL) are of practical interest for memory applications because of different mechanism of electric conductance switching in the crystalline phase. In the work, electrical switching behavior of individual SL grains was examined employing a multimode scanning probe microscope (MSPM) in a lithography mode at room temperature. Using programmed bias voltage with different amplitude and pulse duration, we observed the position-dependent variations of the switching voltage and the current injection delay for [(GeTe)2 (Sb2Te3)]4 SLs on Si(100). The results shed a light on the role of electric field and hot-electron injection on the SL conductance switching.

scholarly journals Dual-mode operation of 2D material-base hot electron transistors

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Yann-Wen Lan ◽  
Carlos M. Torres, ◽  
Xiaodan Zhu ◽  
Hussam Qasem ◽  
James R. Adleman ◽  
...  
Keyword(s):  
Material Base ◽  
Hot Electron ◽  
Dual Mode ◽  
2D Material ◽  
Mode Operation ◽  
Electron Transistors

Imaging molecules adsorbed onto electrodes under potential control by scanning probe microscopy

1991 ◽  
Vol 49 ◽  
pp. 376-377 ◽  
Author(s):  
N.J. Tao ◽  
J.A. DeRose ◽  
P.I. Oden ◽  
S.M. Lindsay
Keyword(s):  
Surface Charge ◽  
Environmental Effects ◽  
Scanning Probe Microscopy ◽  
Statistical Significance ◽  
Electrochemical Methods ◽  
Surface Structures ◽  
Scanning Probe ◽  
Potential Control ◽  
Afm Imaging ◽  
Special Circumstances

Clemmer and Beebe have pointed out that surface structures on graphite substrates can be misinterpreted as biopolymer images in STM experiments. We have been using electrochemical methods to react DNA fragments onto gold electrodes for STM and AFM imaging. The adsorbates produced in this way are only homogeneous in special circumstances. Searching an inhomogeneous substrate for ‘desired’ images limits the value of the data. Here, we report on a reversible method for imaging adsorbates. The molecules can be lifted onto and off the substrate during imaging. This leaves no doubt about the validity or statistical significance of the images. Furthermore, environmental effects (such as changes in electrolyte or surface charge) can be investigated easily.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

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