scholarly journals X‐Ray Detectors: Sensitive and Fast Direct Conversion X‐Ray Detectors Based on Single‐Crystalline HgI 2 Photoconductor and ZnO Nanowire Vacuum Diode (Adv. Mater. Technol. 5/2020)

2020 ◽  
Vol 5 (5) ◽  
pp. 2070029
Author(s):  
Zhipeng Zhang ◽  
Zhaojun Zhang ◽  
Wei Zheng ◽  
Kai Wang ◽  
Huanjun Chen ◽  
...  
Keyword(s):  
Direct Conversion ◽  
Vacuum Diode ◽  
Zno Nanowire ◽  
Single Crystalline ◽  
X Ray

Sensitive and Fast Direct Conversion X‐Ray Detectors Based on Single‐Crystalline HgI 2 Photoconductor and ZnO Nanowire Vacuum Diode

2020 ◽  
Vol 5 (5) ◽  
pp. 1901108
Author(s):  
Zhipeng Zhang ◽  
Zhaojun Zhang ◽  
Wei Zheng ◽  
Kai Wang ◽  
Huanjun Chen ◽  
...  
Keyword(s):  
Direct Conversion ◽  
Vacuum Diode ◽  
Zno Nanowire ◽  
Single Crystalline ◽  
X Ray

X-ray photoemission and bremsstrahlung isochromat spectroscopy of bulk single crystalline SixGe1−x alloys

1998 ◽  
Vol 88-91 ◽  
pp. 395-398 ◽  
Author(s):  
Y. Saito ◽  
S. Fujimori ◽  
S. Suzuki ◽  
S. Sato ◽  
T. Honda ◽  
...  
Keyword(s):  
Single Crystalline ◽  
X Ray

Properties of Epitaxial SrTiO3 Thin Films Grown on Silicon by Molecular Beam Epitaxy

1999 ◽  
Vol 567 ◽  
Author(s):  
Z. Yu ◽  
R. Droopad ◽  
J. Ramdani ◽  
J.A. Curless ◽  
C.D. Overgaard ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
High Energy ◽  
State Density ◽  
Unit Cell ◽  
Ex Situ ◽  
Silicon Oxide Layer ◽  
Single Crystalline ◽  
X Ray

ABSTRACTSingle crystalline perovskite oxides such as SrTiO3 (STO) are highly desirable for future generation ULSI applications. Over the past three decades, development of crystalline oxides on silicon has been a great technological challenge as an amorphous silicon oxide layer forms readily on the Si surface when exposed to oxygen preventing the intended oxide heteroepitaxy on Si substrate. Recently, we have successfully grown epitaxial STO thin films on Si(001) surface by using molecular beam epitaxy (MBE) method. Properties of the STO films on Si have been characterized using a variety of techniques including in-situ reflection high energy electron diffraction (RHEED), ex-situ X-ray diffraction (XRD), spectroscopic ellipsometry (SE), Auger electron spectroscopy (AES) and atomic force microscopy (AFM). The STO films grown on Si(001) substrate show bright and streaky RHEED patterns indicating coherent two-dimensional epitaxial oxide film growth with its unit cell rotated 450 with respect to the underlying Si unit cell. RHEED and XRD data confirm the single crystalline nature and (001) orientation of the STO films. An X-ray pole figure indicates the in-plane orientation relationship as STO[100]//Si[110] and STO(001)// Si(001). The STO surface is atomically smooth with AFM rms roughness of 1.2 AÅ. The leakage current density is measured to be in the low 10−9 A/cm2 range at 1 V, after a brief post-growth anneal in O2. An interface state density Dit = 4.6 × 1011 eV−1 cm−2 is inferred from the high-frequency and quasi-static C-V characteristics. The effective oxide thickness for a 200 Å STO film is around 30 Å and is not sensitive to post-growth anneal in O2 at 500-700°C. These STO films are also robust against forming gas anneal. Finally, STO MOSFET structures have been fabricated and tested. An extrinsic carrier mobility value of 66 cm2 V−11 s−1 is obtained for an STO PMOS device with a 2 μm effective gate length.

An 8-inch diagonal ZnO nanowire cold cathode panel for flat-panel X-ray source

2018 ◽  
Author(s):  
Daokun Chen ◽  
Guofu Zhang ◽  
Zhipeng Zhang ◽  
Keshuang Zheng ◽  
Shaozhi Deng ◽  
...  
Keyword(s):  
Cold Cathode ◽  
Zno Nanowire ◽  
Flat Panel ◽  
X Ray

Direct-conversion flat-panel X-ray image detectors

2002 ◽  
Vol 149 (2) ◽  
pp. 85-96 ◽  
Author(s):  
S.O. Kasap ◽  
J.A. Rowlands
Keyword(s):  
Direct Conversion ◽  
Flat Panel ◽  
X Ray

Single Variant Orientational Growth of Yba2Cu3O7-x on Vicinal (011) SrTiO3 Substrates.

1995 ◽  
Vol 401 ◽  
Author(s):  
A. L. Vasiliev ◽  
D. S. Linehan ◽  
E. P. Kvam ◽  
L. Hou ◽  
M. W. McElfresh
Keyword(s):  
Second Phase ◽  
Surface Cracks ◽  
Electron Microscopic ◽  
Ybco Films ◽  
Single Crystalline ◽  
X Ray ◽  
Transmission Electron ◽  
Transmission Electron Microscopic

AbstractThe results of a transmission electron microscopic (TEM) and X-ray microanalysis (EDS) study of Yba2Cu3O7-x (YBCO) films grown on vicinal (011) SrTiO3 substrates are presented. The YBCO films tend to be single crystalline grown in single variant orientation with c-axis =;45° from the surface. Cracks, second phase precipitates (CuO and Y2O3), and a few small YBCO grains in other orientations were revealed in the films.

Nucleation Engineering in Sprayed MA3Bi2I9 Films for Direct-Conversion X-ray Detectors

2022 ◽  
pp. 371-377
Author(s):  
Deyu Xin ◽  
Siyin Dong ◽  
Min Zhang ◽  
Shujie Tie ◽  
Jiwei Ren ◽  
...  
Keyword(s):  
Direct Conversion ◽  
X Ray

X-ray-to-current signal conversion characteristics of trench-structured photodiodes for direct-conversion-type silicon X-ray sensor

2017 ◽  
Vol 56 (4S) ◽  
pp. 04CH06 ◽  
Author(s):  
Tetsuya Ariyoshi ◽  
Shota Funaki ◽  
Kenji Sakamoto ◽  
Akiyoshi Baba ◽  
Yutaka Arima
Keyword(s):  
Direct Conversion ◽  
Current Signal ◽  
X Ray ◽  
Signal Conversion ◽  
Type Silicon
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