Three-dimensional Electrical Property Mapping with Nanometer Resolution
2016 ◽
Vol 2016
◽
pp. 1-6
◽
Non-scanning, non-interferometric, three-dimensional optical prof ilometer with nanometer resolution
2011 ◽
Vol 9
(10)
◽
pp. 101202-101204
◽
2008 ◽
Vol 112
(26)
◽
pp. 9769-9776
◽
Keyword(s):
2004 ◽
Vol 177
(12)
◽
pp. 4626-4631
◽
2011 ◽
Vol 193
(2)
◽
pp. 333-346
◽
1998 ◽
Vol 69
(7)
◽
pp. 2762-2766
◽
Keyword(s):