2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)
Latest Publications

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Published By IEEE

9781467367325

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Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177877 ◽

2015 ◽

Author(s):

Hani Malloug ◽

Manuel J. Barragan ◽

Salvador Mir

Keyword(s):

Sinusoidal Signal ◽

Signal Generation ◽

Mixed Signal ◽

Harmonic Cancellation

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Oscillation-based approach applied to a low-power analog front-end for an implantable cardiac device

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177878 ◽

2015 ◽

Author(s):

J. A. Miguel ◽

D. Rivas ◽

Y. Lechuga ◽

M. A. Allende ◽

M. Martinez

Keyword(s):

Low Power ◽

Cardiac Device ◽

Front End ◽

Analog Front End ◽

Implantable Cardiac Device

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Structure preserving modeling for safety critical systems

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177866 ◽

2015 ◽

Cited By ~ 4

Author(s):

Gurkan Uygur ◽

Sebastian M. Sattler

Keyword(s):

Critical Systems ◽

Structure Preserving ◽

Safety Critical ◽

Safety Critical Systems

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Verification and validation of AMS systems: Towards coverage of uncertainties

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177882 ◽

2015 ◽

Cited By ~ 1

Author(s):

Christoph Grimm ◽

Carna Radojicic

Keyword(s):

Verification And Validation

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ACR BER correlation to ATE for a COFDM VHF RX

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177861 ◽

2015 ◽

Author(s):

Peter Sarson

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Determination of the aging offset voltage of AMR sensors based on accelerated degradation test

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177871 ◽

2015 ◽

Author(s):

Andreina Zambrano ◽

Hans G. Kerkhoff

Keyword(s):

Accelerated Degradation ◽

Offset Voltage ◽

Degradation Test ◽

Accelerated Degradation Test

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A CAD integrated solution of substrate modeling for industrial IC design

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177885 ◽

2015 ◽

Cited By ~ 1

Author(s):

Hao Zou ◽

Yasser Moursy ◽

Ramy Iskander ◽

Jean-Paul Chaput ◽

Marie-Minerve Louerat ◽

...

Keyword(s):

Ic Design

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Timing measurement BOST with multi-bit delta-sigma TDC

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177881 ◽

2015 ◽

Cited By ~ 4

Author(s):

Takeshi Chujo ◽

Daiki Hirabayashi ◽

Takuya Arafune ◽

Shohei Shibuya ◽

Shu Sasaki ◽

...

Keyword(s):

Delta Sigma ◽

Timing Measurement

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A jitter injection signal generation and extraction system for embedded test of high-speed data I/O

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177879 ◽

2015 ◽

Author(s):

Yan Li ◽

Steven Bielby ◽

Azhar Chowdhury ◽

Gordon W. Roberts

Keyword(s):

High Speed ◽

Signal Generation ◽

Extraction System ◽

Embedded Test ◽

High Speed Data

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Experiences with an industrial analog fault simulator and engineering intuition

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) ◽

10.1109/ims3tw.2015.7177867 ◽

2015 ◽

Cited By ~ 7

Author(s):

Stephen Sunter

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2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST

Oscillation-based approach applied to a low-power analog front-end for an implantable cardiac device

Structure preserving modeling for safety critical systems

Verification and validation of AMS systems: Towards coverage of uncertainties

ACR BER correlation to ATE for a COFDM VHF RX

Determination of the aging offset voltage of AMR sensors based on accelerated degradation test

A CAD integrated solution of substrate modeling for industrial IC design

Timing measurement BOST with multi-bit delta-sigma TDC

A jitter injection signal generation and extraction system for embedded test of high-speed data I/O

Experiences with an industrial analog fault simulator and engineering intuition

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)
Latest Publications