2009 IEEE International Conference on Microelectronic Test Structures
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9781424442591

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2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814602 ◽

2009 ◽

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An Analysis of Temperature Impact on MOSFET Mismatch

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814610 ◽

2009 ◽

Cited By ~ 10

Author(s):

S. Mennillo ◽

A. Spessot ◽

L. Vendrame ◽

L. Bortesi

Keyword(s):

Temperature Impact

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Parameter extraction for the PSP MOSFET model by the combination of genetic and Levenberg-Marquardt algorithms

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814627 ◽

2009 ◽

Cited By ~ 9

Author(s):

Q. Zhou ◽

W. Yao ◽

W. Wu ◽

X. Li ◽

Z. Zhu ◽

...

Keyword(s):

Parameter Extraction ◽

Levenberg Marquardt

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[Breaker pages]

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814630 ◽

2009 ◽

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Electrical Test Structures for Investigating the Effects of Optical Proximity Correction

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814632 ◽

2009 ◽

Cited By ~ 2

Author(s):

A. Tsiamis ◽

S. Smith ◽

M. McCallum ◽

A.C. Hourd ◽

J.T.M. Stevenson ◽

...

Keyword(s):

Electrical Test ◽

Optical Proximity Correction

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High precision on-wafer backend capacitor mismatch measurements using a benchtop semiconductor characterization system

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814598 ◽

2009 ◽

Cited By ~ 8

Author(s):

Hans Tuinhout ◽

Fleur van Rossem ◽

Nicole Wils

Keyword(s):

High Precision ◽

Capacitor Mismatch ◽

Semiconductor Characterization ◽

Semiconductor Characterization System

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Array Test Structure for Ultra-Thin Gate Oxide Degradation Issues

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814616 ◽

2009 ◽

Cited By ~ 2

Author(s):

Kristian M. Hafkemeyer ◽

Andreas Domdey ◽

Dietmar Schroeder ◽

Wolfgang H. Krautschneider

Keyword(s):

Gate Oxide ◽

Test Structure ◽

Oxide Degradation ◽

Thin Gate Oxide

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Estimating MOSFET Leakage from Low-cost, Low-resolution Fast Parametric Test

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814623 ◽

2009 ◽

Cited By ~ 1

Author(s):

Sharad Saxena ◽

Takumi Uezono ◽

Rakesh Vallishayee ◽

Ron Lindley ◽

Andrew Swimmer ◽

...

Keyword(s):

Low Cost ◽

Low Resolution ◽

Parametric Test

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Addressable Arrays Implemented with One Metal Level for MOSFET and Resistor Variability Characterization

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814600 ◽

2009 ◽

Cited By ~ 4

Author(s):

Mark B. Ketchen ◽

Manjul Bhushan ◽

Greg Costrini

Keyword(s):

Metal Level

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Characterization and Model Parameter Extraction of Symmetrical Centre Tapped Inductor using Build in Mixed Mode and Pure Differential S-Parameters

2009 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.2009.4814636 ◽

2009 ◽

Author(s):

F. Gianesello ◽

Y. Morandini ◽

S. Boret ◽

D. Gloria

Keyword(s):

Mixed Mode ◽

Parameter Extraction ◽

Model Parameter ◽

S Parameters

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2009 IEEE International Conference on Microelectronic Test StructuresLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

[Breaker pages]

An Analysis of Temperature Impact on MOSFET Mismatch

Parameter extraction for the PSP MOSFET model by the combination of genetic and Levenberg-Marquardt algorithms

[Breaker pages]

Electrical Test Structures for Investigating the Effects of Optical Proximity Correction

High precision on-wafer backend capacitor mismatch measurements using a benchtop semiconductor characterization system

Array Test Structure for Ultra-Thin Gate Oxide Degradation Issues

Estimating MOSFET Leakage from Low-cost, Low-resolution Fast Parametric Test

Addressable Arrays Implemented with One Metal Level for MOSFET and Resistor Variability Characterization

Characterization and Model Parameter Extraction of Symmetrical Centre Tapped Inductor using Build in Mixed Mode and Pure Differential S-Parameters

2009 IEEE International Conference on Microelectronic Test Structures
Latest Publications