The Surface Properties of Oxidized Silicon
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Published By Springer Berlin Heidelberg

9783662392041, 9783662402108

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The Surface Charge in Oxidized Silicon

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_7 ◽

1967 ◽

pp. 114-132 ◽

Cited By ~ 1

Author(s):

E. Kooi

Keyword(s):

Surface Charge

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Influence of X-Ray Irradiations on the Charge Distributions in Metal-Oxide-Silicon Structures

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_5 ◽

1967 ◽

pp. 81-89

Author(s):

E. Kooi

Keyword(s):

Metal Oxide ◽

X Ray ◽

Charge Distributions ◽

Silicon Structures ◽

Metal Oxide Silicon

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General Review of the Effect of Silicon-Dioxide Coatings on the Surface Properties of Silicon and the Importance of these Coatings in Semiconductor-Device Technology

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_2 ◽

1967 ◽

pp. 3-51

Author(s):

E. Kooi

Keyword(s):

Silicon Dioxide ◽

Surface Properties ◽

Semiconductor Device ◽

General Review ◽

Device Technology

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Effects of Ionizing Irradiations on the Properties of Oxide-Covered Silicon Surfaces

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_6 ◽

1967 ◽

pp. 90-113

Author(s):

E. Kooi

Keyword(s):

Silicon Surfaces

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Introduction

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_1 ◽

1967 ◽

pp. 1-2

Author(s):

E. Kooi

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Diffusion of Phosphorus into Silicon and the Masking Action of Silicon-Dioxide Films

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_3 ◽

1967 ◽

pp. 52-63 ◽

Cited By ~ 1

Author(s):

E. Kooi

Keyword(s):

Silicon Dioxide ◽

Silicon Dioxide Films

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Effects of Low-Temperature Heat Treatments on the Surface Properties of Oxidized Silicon

The Surface Properties of Oxidized Silicon ◽

10.1007/978-3-662-40210-8_4 ◽

1967 ◽

pp. 64-80

Author(s):

E. Kooi

Keyword(s):

Low Temperature ◽

Surface Properties ◽

Heat Treatments ◽

Temperature Heat

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