Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
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Published By ASTM International

9780803166127

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Application of a Conducting Mask for Thinning Metallic Foils for Electron Transmission Microscopy

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48330s ◽

2009 ◽

pp. 24-24-7

Author(s):

Thomas A. Despres

Keyword(s):

Transmission Microscopy ◽

Electron Transmission ◽

Electron Transmission Microscopy ◽

Metallic Foils

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Introduction

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48327s ◽

2009 ◽

pp. 1-1-1

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Investigation of Microstructure and Room-Temperature Fracture in SM-200 Nickel-Base Alloy

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48331s ◽

2009 ◽

pp. 31-31-13

Author(s):

R. W. Hertzberg ◽

J. A. Ford

Keyword(s):

Room Temperature ◽

Base Alloy ◽

Nickel Base Alloy ◽

Temperature Fracture ◽

Nickel Base

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Two New Indexes to the Powder Diffraction File

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48334s ◽

2009 ◽

pp. 54-54-36

Author(s):

W. C. Bigelow ◽

J. V. Smith

Keyword(s):

Powder Diffraction ◽

Powder Diffraction File

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Specimen Damage during Cutting and Grinding

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48328s ◽

2009 ◽

pp. 3-3-7 ◽

Cited By ~ 2

Author(s):

A. Szirmae ◽

R. M. Fisher

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Microconstituents in High-Speed Steel

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48332s ◽

2009 ◽

pp. 44-44-7

Author(s):

P. K. Koh ◽

H. Nikkel

Keyword(s):

High Speed ◽

High Speed Steel

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Electron Microscopy of Stress-Corrosion Cracking in AM 350 Steel for a Supersonic Transport

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48329s ◽

2009 ◽

pp. 10-10-14

Author(s):

N. A. Tiner

Keyword(s):

Electron Microscopy ◽

Stress Corrosion ◽

Stress Corrosion Cracking ◽

Corrosion Cracking ◽

Supersonic Transport

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Variable Bias Illumination Control for the Electron Microscope

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis ◽

10.1520/stp48333s ◽

2009 ◽

pp. 51-51-3

Author(s):

J. O. McPartland ◽

J. L. Daniel

Keyword(s):

Electron Microscope ◽

Variable Bias

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Techniques of Electron Microscopy, Diffraction, and Microprobe AnalysisLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By ASTM International

Application of a Conducting Mask for Thinning Metallic Foils for Electron Transmission Microscopy

Introduction

Investigation of Microstructure and Room-Temperature Fracture in SM-200 Nickel-Base Alloy

Two New Indexes to the Powder Diffraction File

Specimen Damage during Cutting and Grinding

Microconstituents in High-Speed Steel

Electron Microscopy of Stress-Corrosion Cracking in AM 350 Steel for a Supersonic Transport

Variable Bias Illumination Control for the Electron Microscope

Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
Latest Publications