Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing
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Economic Resource Sharing in ATM Network

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496105 ◽

2005 ◽

Author(s):

Jiann-Liang Chen ◽

Ginkou Ma ◽

Bau-Shuh ◽

P. Lin

Keyword(s):

Resource Sharing ◽

Economic Resource ◽

Atm Network

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Test strategy selection for multi-chip systems

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496097 ◽

2002 ◽

Author(s):

M. FARES ◽

B. KAMINSKA

Keyword(s):

Strategy Selection ◽

Test Strategy ◽

Selection For

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Economic analysis of test and known good die for multichip assemblies

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496098 ◽

2002 ◽

Cited By ~ 1

Author(s):

C.F. MURPHY ◽

M. S. ABADIR ◽

P. A. SANDBORN

Keyword(s):

Economic Analysis ◽

Known Good Die

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The need for highly integrated manufacturing test equipment

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496101 ◽

2002 ◽

Cited By ~ 1

Author(s):

J. T. Healy

Keyword(s):

Test Equipment ◽

Integrated Manufacturing ◽

Manufacturing Test

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Economic considerations in tolerance design

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496094 ◽

2002 ◽

Author(s):

R.H. Williams ◽

C. F. Hawkins

Keyword(s):

Tolerance Design ◽

Economic Considerations

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Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496102 ◽

2002 ◽

Cited By ~ 2

Author(s):

N. Nagi ◽

J. A. Abraham

Keyword(s):

Dynamic Testing ◽

Mixed Signal ◽

Mixed Signal Circuits ◽

Trade Offs ◽

Testing Techniques

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System test cost modelling based on event rate analysis

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496089 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Farren ◽

A. P. Ambler

Keyword(s):

Event Rate ◽

Test Cost ◽

Rate Analysis ◽

Cost Modelling

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Economic resource sharing in ATM network

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496084 ◽

2002 ◽

Author(s):

Jiann-Liang Chen ◽

Ginkou Ma ◽

Bao-Shuh Lin

Keyword(s):

Resource Sharing ◽

Economic Resource ◽

Atm Network

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Simultaneous partitioning, scheduling and allocation for synthesis of multi-chip module architectures

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496100 ◽

2002 ◽

Cited By ~ 2

Author(s):

R. V. Cherabuddi ◽

Lih-Yih Chiou ◽

M. A. Bayoumi

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Modeling test cost of ownership

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing ◽

10.1109/icedtm.1994.496087 ◽

2002 ◽

Cited By ~ 2

Author(s):

D. L. Dance

Keyword(s):

Test Cost ◽

Cost Of Ownership

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Proceedings of 3rd International Workshop on the Economics of Design, Test and ManufacturingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Economic Resource Sharing in ATM Network

Test strategy selection for multi-chip systems

Economic analysis of test and known good die for multichip assemblies

The need for highly integrated manufacturing test equipment

Economic considerations in tolerance design

Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits

System test cost modelling based on event rate analysis

Economic resource sharing in ATM network

Simultaneous partitioning, scheduling and allocation for synthesis of multi-chip module architectures

Modeling test cost of ownership

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing
Latest Publications