Modeling Aspects in Optical Metrology VII
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9781510627932, 9781510627949
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Felix Binkowski ◽  
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Transmission telescope optical metrology (Conference Presentation)

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Optical Metrology

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Matti A. Eskelinen ◽  
Clarence J. Zarobila ◽  
David W. Allen
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Physical optics modeling of interferometer-based metrology systems (Conference Presentation)

2019 ◽  
Author(s):  
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Physical Optics

An improved method to derive best-fit parameters and their uncertainties from depolarizing Mueller-matrices (Conference Presentation)

2019 ◽  
Author(s):  
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Improved Method ◽  
Mueller Matrices ◽  
Best Fit
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