Surface and Thin Film Analysis
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Published By Wiley-VCH Verlag Gmbh & Co. Kgaa

9783527636921, 9783527320479

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Other Ion-Detecting Techniques

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch16 ◽

2011 ◽

pp. 261-264

Author(s):

John C. Rivière

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Nuclear Reaction Analysis (NRA)

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch14 ◽

2011 ◽

pp. 229-236

Author(s):

Oswald Benka

Keyword(s):

Nuclear Reaction ◽

Nuclear Reaction Analysis

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Glow Discharge Optical Emission Spectroscopy (GD-OES)

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch20 ◽

2011 ◽

pp. 329-344 ◽

Cited By ~ 1

Author(s):

Volker Hoffmann ◽

Alfred Quentmeier

Keyword(s):

Glow Discharge ◽

Emission Spectroscopy ◽

Optical Emission Spectroscopy ◽

Optical Emission

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Appendix B: Surface and Thin-Film Analytical Equipment Suppliers

Surface and Thin Film Analysis ◽

10.1002/9783527636921.app2 ◽

2011 ◽

pp. 507-517

Keyword(s):

Thin Film ◽

Analytical Equipment

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Surface Raman Spectroscopy

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch24 ◽

2011 ◽

pp. 377-391

Author(s):

Wieland Hill ◽

Bernhard Lendl

Keyword(s):

Raman Spectroscopy

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Scanning Near-Field Optical Microscopy (SNOM)

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch31 ◽

2011 ◽

pp. 481-497 ◽

Cited By ~ 2

Author(s):

Marc Richter ◽

Volker Deckert

Keyword(s):

Optical Microscopy ◽

Near Field

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Other Electron-Detecting Techniques

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch6 ◽

2011 ◽

pp. 111-113

Author(s):

John C. Rivière

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Low-Energy Ion Scattering (LEIS)

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch12 ◽

2011 ◽

pp. 203-215 ◽

Cited By ~ 4

Author(s):

Peter Bauer

Keyword(s):

Low Energy ◽

Ion Scattering ◽

Low Energy Ion Scattering

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Grazing Incidence X-Ray Methods for Near-Surface Structural Studies

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch19 ◽

2011 ◽

pp. 311-327 ◽

Cited By ~ 2

Author(s):

P. Neil Gibson

Keyword(s):

Grazing Incidence ◽

Structural Studies ◽

Near Surface ◽

X Ray ◽

Ray Methods

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Rutherford Backscattering Spectroscopy (RBS)

Surface and Thin Film Analysis ◽

10.1002/9783527636921.ch11 ◽

2011 ◽

pp. 191-202 ◽

Cited By ~ 1

Author(s):

Leopold Palmetshofer

Keyword(s):

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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