Records of the 1993 IEEE International Workshop on Memory Testing
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Published By IEEE Comput. Soc. Press

0818641509

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A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263157 ◽

2002 ◽

Cited By ~ 5

Author(s):

B.F. Cockburn

Keyword(s):

Test Vector ◽

Coupling Faults ◽

Test Vector Generator

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Key attributes of an SRAM testing strategy required for effective process monitoring

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263144 ◽

2002 ◽

Cited By ~ 11

Author(s):

J. Khare ◽

S. Griep ◽

H.-D. Oberle ◽

W. Maly ◽

D. Schmitt-Landsiedel ◽

...

Keyword(s):

Process Monitoring ◽

Testing Strategy

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A high-speed boundary search Shmoo plot for ULSI memories

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263158 ◽

2002 ◽

Cited By ~ 3

Author(s):

M. Hamada ◽

M. Kumanoya ◽

M. Ishii ◽

T. Kawagoe ◽

M. Niiro

Keyword(s):

High Speed

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Fault location algorithms for repairable embedded RAMs

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263149 ◽

2002 ◽

Author(s):

R. Treuer ◽

V.K. Agarwal

Keyword(s):

Fault Location

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Modeling of faulty behavior of ECL storage elements

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263153 ◽

2002 ◽

Cited By ~ 2

Author(s):

S.M. Menon ◽

Y.K. Malaiya ◽

A.P. Jayasumana

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Are NV-memories non-volatile?

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263141 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Ratchev

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Effective tests for memories based on faults models for low PPM defects

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263142 ◽

2002 ◽

Cited By ~ 2

Author(s):

D. Lam ◽

S.Y. Khim

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An inexpensive method of detecting localised parametric defects in static RAM

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263143 ◽

2002 ◽

Cited By ~ 1

Author(s):

Y. Savaria ◽

C. Thibeault

Keyword(s):

Inexpensive Method ◽

Static Ram

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Functional testing of RAMs by random testing simulation

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263151 ◽

2002 ◽

Cited By ~ 1

Author(s):

M. Ashtijou ◽

Fusheng Chen

Keyword(s):

Random Testing ◽

Functional Testing

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Algorithms to test PSF and coupling faults in random access memories

Records of the 1993 IEEE International Workshop on Memory Testing ◽

10.1109/mt.1993.263150 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Rajsuman

Keyword(s):

Random Access ◽

Coupling Faults

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Records of the 1993 IEEE International Workshop on Memory TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc. Press

A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs

Key attributes of an SRAM testing strategy required for effective process monitoring

A high-speed boundary search Shmoo plot for ULSI memories

Fault location algorithms for repairable embedded RAMs

Modeling of faulty behavior of ECL storage elements

Are NV-memories non-volatile?

Effective tests for memories based on faults models for low PPM defects

An inexpensive method of detecting localised parametric defects in static RAM

Functional testing of RAMs by random testing simulation

Algorithms to test PSF and coupling faults in random access memories

Records of the 1993 IEEE International Workshop on Memory Testing
Latest Publications