2020 IEEE 29th North Atlantic Test Workshop (NATW)
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9781728196992
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Passive Intermodulation (PIM) Test and Measurement

2020 ◽  
Author(s):  
Stephen Moss ◽  
Elanchezhian Veeramani ◽  
Joris Angelo Sundaram Jerome
Keyword(s):  
Passive Intermodulation

Self-heating characterization and its applications in technology development

2020 ◽  
Author(s):  
P. Paliwoda ◽  
M. Toledano-Luque ◽  
T. Nigam ◽  
F. Guarin ◽  
M. Nour ◽  
...  
Keyword(s):  
Technology Development ◽  
Self Heating

Verification and Testing Considerations of an In-Memory AI Chip

2020 ◽  
Author(s):  
Marcia Golmohamadi ◽  
Ryan Jurasek ◽  
Wolfgang Hokenmaier ◽  
Don Labrecque ◽  
Ruoyu Zhi ◽  
...  

AI Powered THz VLSI Testing Technology

2020 ◽  
Author(s):  
Naznin Akter ◽  
Mustafa Karabiyik ◽  
Michael Shur ◽  
John Suarez ◽  
Nezih Pala
Keyword(s):  
Vlsi Testing ◽  
Testing Technology
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