Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
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Published By SPIE

9781510625105, 9781510625112

Author(s):  
Ermes Toninelli ◽  
Thomas Gregory ◽  
Paul-Antoine Moreau ◽  
Miles J. Padgett
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Author(s):  
Christophe Gorecki ◽  
Nicolas Passilly ◽  
Vincent Maurice ◽  
Sylwester Bargiel ◽  
Ravinder Chutani ◽  
...  
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Author(s):  
Kok Chuan Bobby Tan ◽  
Hyunseok Jeong ◽  
Tyler Volkoff ◽  
Hyukjoon Kwon
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Author(s):  
David Wilkowski ◽  
Aik Chan Eng ◽  
Syed Abdullah Aljunid ◽  
Giorgio Adamo ◽  
athanasios laliotis ◽  
...  

Author(s):  
Andrey B. Matsko ◽  
Sergey P. Vyatchanin ◽  
Anatoliy A. Savchenkov ◽  
Skip Williams
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