2012 IEEE Radiation Effects Data Workshop
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9781467327329, 9781467327305
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Total Dose and Transient Response of SiGe HBTs from a New 4th-Generation, 90 nm SiGe BiCMOS Technology

2012 ◽  
Author(s):  
Nelson E. Lourenco ◽  
Robert L. Schmid ◽  
Kurt A. Moen ◽  
Stanley D. Phillips ◽  
Troy D. England ◽  
...  
Keyword(s):  
Total Dose ◽  
Transient Response ◽  
Bicmos Technology ◽  
Sige Bicmos

Programmatic Impact of SDRAM SEFI

2012 ◽  
Author(s):  
Steven M. Guertin ◽  
Gregory R. Allen ◽  
Douglas J. Sheldon

Radiation Test Results on COTS and Non-COTS Electronic Devices for NASA Johnson Space Center Spaceflight Projects

2012 ◽  
Author(s):  
Kimberly K. Allums ◽  
Patrick M. ONeill ◽  
Brandon D. Reddell ◽  
Charles R. Bailey ◽  
Kyson V. Nguyen
Keyword(s):  
Electronic Devices ◽  
Test Results ◽  
Radiation Test

SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device

2012 ◽  
Author(s):  
Craig Hafer ◽  
Matt Von Thun ◽  
Michelle Mundie ◽  
Derek Bass ◽  
Fred Sievert
Keyword(s):  
Test Results

scholarly journals Evaluation of Enhanced Low Dose Rate Sensitivity in Discrete Bipolar Junction Transistors

2012 ◽  
Author(s):  
Dakai Chen ◽  
Alyson Topper ◽  
James Forney ◽  
Brian Triggs ◽  
Tony Kazmakites ◽  
...  
Keyword(s):  
Dose Rate ◽  
Low Dose ◽  
Rate Sensitivity ◽  
Bipolar Junction Transistors ◽  
Low Dose Rate
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