Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences
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9783319753249, 9783319753256

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Introduction

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_1 ◽

2018 ◽

pp. 3-10

Author(s):

O. Stenzel ◽

Miloslav Ohlídal

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In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings I: Basics

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_7 ◽

2018 ◽

pp. 177-202

Author(s):

Olaf Stenzel ◽

Steffen Wilbrandt

Keyword(s):

Ex Situ ◽

Multilayer Coatings

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Cavity Ring-Down Technique for Optical Coating Characterization

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_16 ◽

2018 ◽

pp. 433-456

Author(s):

Christian Karras

Keyword(s):

Optical Coating ◽

Cavity Ring Down

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Data Processing Methods for Imaging Spectrophotometry

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_6 ◽

2018 ◽

pp. 143-175

Author(s):

David Nečas

Keyword(s):

Data Processing ◽

Processing Methods ◽

Data Processing Methods

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In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings II: Experimental Technique and Application Examples

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_8 ◽

2018 ◽

pp. 203-232

Author(s):

Steffen Wilbrandt ◽

Olaf Stenzel

Keyword(s):

Experimental Technique ◽

Ex Situ ◽

Multilayer Coatings

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Absorption and Fluorescence Measurements in Optical Coatings

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_15 ◽

2018 ◽

pp. 407-431

Author(s):

Christian Mühlig

Keyword(s):

Optical Coatings ◽

Fluorescence Measurements

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Resonant Waveguide Grating Structures

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_12 ◽

2018 ◽

pp. 341-358

Author(s):

Stefanie Kroker ◽

Thomas Siefke

Keyword(s):

Waveguide Grating ◽

Resonant Waveguide Grating

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Scanning Probe Microscopy Characterization of Optical Thin Films

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_11 ◽

2018 ◽

pp. 315-339

Author(s):

Petr Klapetek

Keyword(s):

Thin Films ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Characterization

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Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_5 ◽

2018 ◽

pp. 107-141

Author(s):

Miloslav Ohlídal ◽

Jiří Vodák ◽

David Nečas

Keyword(s):

Thin Films ◽

Optical Characterization ◽

Spectroscopic Reflectometry

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Optical Characterization of Thin Films Exhibiting Defects

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences ◽

10.1007/978-3-319-75325-6_10 ◽

2018 ◽

pp. 271-313 ◽

Cited By ~ 3

Author(s):

Ivan Ohlídal ◽

Martin Čermák ◽

Jiří Vohánka

Keyword(s):

Thin Films ◽

Optical Characterization

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Optical Characterization of Thin Solid Films - Springer Series in Surface SciencesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Introduction

In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings I: Basics

Cavity Ring-Down Technique for Optical Coating Characterization

Data Processing Methods for Imaging Spectrophotometry

In Situ and Ex Situ Spectrophotometric Characterization of Single- and Multilayer-Coatings II: Experimental Technique and Application Examples

Absorption and Fluorescence Measurements in Optical Coatings

Resonant Waveguide Grating Structures

Scanning Probe Microscopy Characterization of Optical Thin Films

Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry

Optical Characterization of Thin Films Exhibiting Defects

Optical Characterization of Thin Solid Films - Springer Series in Surface Sciences
Latest Publications