In-situ Materials Characterization - Springer Series in Materials Science
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Published By Springer Berlin Heidelberg

9783642451515, 9783642451522

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_2 ◽

2014 ◽

pp. 39-58 ◽

Cited By ~ 1

Author(s):

Vedran Vonk ◽

Heinz Graafsma

Keyword(s):

Free Electron ◽

Free Electron Laser ◽

X Ray Diffraction ◽

X Ray ◽

Laser Sources

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Scanning Tunneling Microscopy at Elevated Pressure

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_6 ◽

2014 ◽

pp. 181-206 ◽

Cited By ~ 1

Author(s):

Joost W. M. Frenken

Keyword(s):

Scanning Tunneling Microscopy ◽

Elevated Pressure ◽

Scanning Tunneling ◽

Tunneling Microscopy

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In-situ and Kinetic Studies Using Neutrons

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_5 ◽

2014 ◽

pp. 147-179

Author(s):

Götz Eckold ◽

Helmut Schober

Keyword(s):

Kinetic Studies

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Detectors for Electron and X-ray Scattering and Imaging Experiments

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_7 ◽

2014 ◽

pp. 207-250

Author(s):

Alexander Ziegler ◽

Heinz Graafsma

Keyword(s):

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_1 ◽

2014 ◽

pp. 1-38 ◽

Cited By ~ 6

Author(s):

Majed Chergui

Keyword(s):

Absorption Spectroscopy ◽

Molecular Processes ◽

In Situ Characterization ◽

X Ray ◽

X Ray Absorption

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In-situ Transmission Electron Microscopy

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_3 ◽

2014 ◽

pp. 59-109 ◽

Cited By ~ 1

Author(s):

Xiao Feng Zhang

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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Ultrafast Transmission Electron Microscopy and Electron Diffraction

In-situ Materials Characterization - Springer Series in Materials Science ◽

10.1007/978-3-642-45152-2_4 ◽

2014 ◽

pp. 111-145

Author(s):

Alexander Ziegler

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Diffraction ◽

Transmission Electron

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In-situ Materials Characterization - Springer Series in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources

Scanning Tunneling Microscopy at Elevated Pressure

In-situ and Kinetic Studies Using Neutrons

Detectors for Electron and X-ray Scattering and Imaging Experiments

In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy

In-situ Transmission Electron Microscopy

Ultrafast Transmission Electron Microscopy and Electron Diffraction

In-situ Materials Characterization - Springer Series in Materials Science
Latest Publications