Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy
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Published By World Scientific Publishing Company

9789814322805, 9789814322843

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

RAMAN SPECTROSCOPY OF CARBON NANOTUBES AND GRAPHENE MATERIALS AND DEVICES

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0011 ◽

2011 ◽

pp. 479-523 ◽

Cited By ~ 1

Author(s):

Marcus Freitag ◽

James C. Tsang

Keyword(s):

Carbon Nanotubes ◽

Raman Spectroscopy

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BACK MATTER

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_bmatter ◽

2011 ◽

pp. 611-619

Author(s):

Richard Haight ◽

Frances M Ross ◽

James B Hannon

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ULTRAFAST MICROSCOPY OF PLASMON DYNAMICS IN NANOSTRUCTURED METAL SURFACES

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0005 ◽

2011 ◽

pp. 183-210

Author(s):

Hrvoje Petek ◽

Atsushi Kubo

Keyword(s):

Metal Surfaces ◽

Nanostructured Metal

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FRONT MATTER

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_fmatter ◽

2011 ◽

pp. i-xxiv

Author(s):

Richard Haight ◽

Frances M Ross ◽

James B Hannon

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TIME-DOMAIN THERMOREFLECTANCE MEASUREMENTS FOR THERMAL PROPERTY CHARACTERIZATION OF NANOSTRUCTURES

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0013 ◽

2011 ◽

pp. 587-610

Author(s):

Scott T. Huxtable

Keyword(s):

Thermal Property ◽

Time Domain ◽

Property Characterization

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X-RAY DIFFRACTION METHODS FOR STUDYING STRAIN AND COMPOSITION IN EPITAXIAL NANOSTRUCTURED SYSTEMS

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0006 ◽

2011 ◽

pp. 211-279 ◽

Cited By ~ 4

Author(s):

Angelo Malachias ◽

Raul Freitas ◽

Sérgio L. Morelhão ◽

Rogério Magalhães-Paniago ◽

Stefan Kycia ◽

...

Keyword(s):

X Ray Diffraction ◽

X Ray ◽

Nanostructured Systems

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LOW-ENERGY ELECTRON MICROSCOPY FOR NANOSCALE CHARACTERIZATION

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0004 ◽

2011 ◽

pp. 127-181 ◽

Cited By ~ 1

Author(s):

James B. Hannon ◽

Rudolf M. Tromp

Keyword(s):

Electron Microscopy ◽

Low Energy ◽

Energy Electron ◽

Nanoscale Characterization ◽

Low Energy Electron

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ABERRATION CORRECTED ELECTRON MICROSCOPY

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0003 ◽

2011 ◽

pp. 89-125 ◽

Cited By ~ 1

Author(s):

Philip E. Batson

Keyword(s):

Electron Microscopy ◽

Aberration Corrected

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STM OF SELF ASSEMBLED III–V NANOSTRUCTURES

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0009 ◽

2011 ◽

pp. 369-406

Author(s):

Vaishno D. Dasika ◽

Rachel S. Goldman

Keyword(s):

Self Assembled

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STRESS DETERMINATION IN SEMICONDUCTOR NANOSTRUCTURES USING X-RAY DIFFRACTION

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy ◽

10.1142/9789814322843_0007 ◽

2011 ◽

pp. 281-312

Author(s):

Conal E. Murray ◽

I. Cevdet Noyan

Keyword(s):

Semiconductor Nanostructures ◽

Stress Determination ◽

X Ray Diffraction ◽

X Ray

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Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and EnergyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By World Scientific Publishing Company

RAMAN SPECTROSCOPY OF CARBON NANOTUBES AND GRAPHENE MATERIALS AND DEVICES

BACK MATTER

ULTRAFAST MICROSCOPY OF PLASMON DYNAMICS IN NANOSTRUCTURED METAL SURFACES

FRONT MATTER

TIME-DOMAIN THERMOREFLECTANCE MEASUREMENTS FOR THERMAL PROPERTY CHARACTERIZATION OF NANOSTRUCTURES

X-RAY DIFFRACTION METHODS FOR STUDYING STRAIN AND COMPOSITION IN EPITAXIAL NANOSTRUCTURED SYSTEMS

LOW-ENERGY ELECTRON MICROSCOPY FOR NANOSCALE CHARACTERIZATION

ABERRATION CORRECTED ELECTRON MICROSCOPY

STM OF SELF ASSEMBLED III–V NANOSTRUCTURES

STRESS DETERMINATION IN SEMICONDUCTOR NANOSTRUCTURES USING X-RAY DIFFRACTION

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization - Materials and Energy
Latest Publications