19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings

Experimental verification of timing measurement circuit with self-calibration

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997393 ◽

2014 ◽

Cited By ~ 9

Author(s):

Takeshi Chujo ◽

Daiki Hirabayashi ◽

Congbing Li ◽

Yutaro Kobayashi ◽

Junshan Wang ◽

...

Keyword(s):

Experimental Verification ◽

Measurement Circuit ◽

Self Calibration ◽

Timing Measurement

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Integrated cross-layer solutions for enabling silicon photonics into future chip multiprocessors

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997403 ◽

2014 ◽

Cited By ~ 1

Author(s):

Paolo Grani ◽

Sandro Bartolini ◽

Emanuele Furdiani ◽

Luca Ramini ◽

Davide Bertozzi

Keyword(s):

Silicon Photonics ◽

Chip Multiprocessors ◽

Cross Layer

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The influence of No Fault Found in analogue CMOS circuits

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997388 ◽

2014 ◽

Cited By ~ 7

Author(s):

Jinbo Wan ◽

Hans G. Kerkhoff

Keyword(s):

Cmos Circuits

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ATPG for mixed-signal circuits using commercial digital tools

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997394 ◽

2014 ◽

Cited By ~ 1

Author(s):

Carsten Wegener

Keyword(s):

Digital Tools ◽

Mixed Signal ◽

Mixed Signal Circuits

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Phase noise measurement techniques using delta-sigma TDC

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997392 ◽

2014 ◽

Cited By ~ 7

Author(s):

Yusuke Osawa ◽

Daiki Hirabayashi ◽

Naohiro Harigai ◽

Haruo Kobayashi ◽

Kiichi Niitsu ◽

...

Keyword(s):

Phase Noise ◽

Measurement Techniques ◽

Noise Measurement ◽

Delta Sigma

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Low cost test architecture for mixed-signal integrated circuits

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997389 ◽

2014 ◽

Author(s):

Julio L. da Silva ◽

Emerson Camargo ◽

Douglas Foster ◽

Sandro T. Coelho ◽

Antonio G. de Oliveira ◽

...

Keyword(s):

Integrated Circuits ◽

Low Cost ◽

Mixed Signal ◽

Test Architecture

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Stochastic model for phase noise measurement from 1-bit signal acquisition

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997400 ◽

2014 ◽

Cited By ~ 1

Author(s):

Stephane David-Grignot ◽

Florence Azais ◽

Laurent Latorre ◽

Francois Lefevre

Keyword(s):

Stochastic Model ◽

Phase Noise ◽

Noise Measurement ◽

Signal Acquisition

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Measuring the impact of voltage scaling for soft errors in SRAM-based FPGAs from a designer perspective

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997398 ◽

2014 ◽

Author(s):

Jorge Tonfat ◽

Jose Rodrigo Azambuja ◽

Gabriel Nazar ◽

Paolo Rech ◽

Fernanda Lima Kastensmidt ◽

...

Keyword(s):

Soft Errors ◽

Voltage Scaling ◽

The Impact

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An electro-chemical test and optimization system for impressed current cathodic corrosion protection

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997399 ◽

2014 ◽

Cited By ~ 1

Author(s):

A. Andre Chang ◽

Jasbir N. Patel ◽

Haleh Shahbazbegian ◽

Bozena Kaminska

Keyword(s):

Corrosion Protection ◽

Chemical Test ◽

Optimization System ◽

Impressed Current

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Non-intrusive built-in test for 65nm RF LNA

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings ◽

10.1109/ims3tw.2014.6997397 ◽

2014 ◽

Cited By ~ 1

Author(s):

Athanasios Dimakos ◽

Haralampos-G. Stratigopoulos ◽

Alexandre Siligaris ◽

Salvador Mir ◽

Emeric De Foucauld

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19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Experimental verification of timing measurement circuit with self-calibration

Integrated cross-layer solutions for enabling silicon photonics into future chip multiprocessors

The influence of No Fault Found in analogue CMOS circuits

ATPG for mixed-signal circuits using commercial digital tools

Phase noise measurement techniques using delta-sigma TDC

Low cost test architecture for mixed-signal integrated circuits

Stochastic model for phase noise measurement from 1-bit signal acquisition

Measuring the impact of voltage scaling for soft errors in SRAM-based FPGAs from a designer perspective

An electro-chemical test and optimization system for impressed current cathodic corrosion protection

Non-intrusive built-in test for 65nm RF LNA

Export Citation Format

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop ProceedingsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Experimental verification of timing measurement circuit with self-calibration

Integrated cross-layer solutions for enabling silicon photonics into future chip multiprocessors

The influence of No Fault Found in analogue CMOS circuits

ATPG for mixed-signal circuits using commercial digital tools

Phase noise measurement techniques using delta-sigma TDC

Low cost test architecture for mixed-signal integrated circuits

Stochastic model for phase noise measurement from 1-bit signal acquisition

Measuring the impact of voltage scaling for soft errors in SRAM-based FPGAs from a designer perspective

An electro-chemical test and optimization system for impressed current cathodic corrosion protection

Non-intrusive built-in test for 65nm RF LNA

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings
Latest Publications