Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04
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ICMTS 2004 Chairman's Letter

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309288 ◽

2005 ◽

Author(s):

Y. Hagiwara

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Design and measurements of test element group wafer thinned to 10 μm for 3D system in package

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309471 ◽

2004 ◽

Cited By ~ 2

Author(s):

A. Ikeda ◽

T. Kuwata ◽

S. Kajiwara ◽

T. Fujimura ◽

H. Kuriyaki ◽

...

Keyword(s):

Test Element ◽

Element Group

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Test chip characterization of X architecture diagonal lines for SoC design

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309305 ◽

2004 ◽

Cited By ~ 4

Author(s):

N.D. Arora ◽

L. Song ◽

S. Shah ◽

K. Joshi ◽

K. Thumaty ◽

...

Keyword(s):

Test Chip ◽

X Architecture

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Leakage current correction in quasi-static C-V measurements

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309475 ◽

2004 ◽

Cited By ~ 3

Author(s):

J. Schmitz ◽

M.H.H. Weusthof ◽

A.J. Hof

Keyword(s):

Leakage Current

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Further study of V/sub TH/-mismatch evaluation circuit

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309470 ◽

2004 ◽

Cited By ~ 1

Author(s):

K. Terada ◽

K. Fukeda

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On-chip di/dt detector circuit for power supply line

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309294 ◽

2004 ◽

Cited By ~ 3

Author(s):

T. Nakura ◽

M. Ikeda ◽

K. Asada

Keyword(s):

Power Supply ◽

Supply Line ◽

On Chip

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Measuring the span of stress asymmetries on high-precision matched devices

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309463 ◽

2004 ◽

Cited By ~ 6

Author(s):

H.P. Tuinhout ◽

A. Bretveld ◽

W.C.M. Peters

Keyword(s):

High Precision

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Device characterizations and physical models of strained-Si channel CMOS

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309466 ◽

2004 ◽

Author(s):

T. Maeda ◽

T. Numata ◽

T. Mizuno ◽

K. Usuda ◽

A. Tanabe ◽

...

Keyword(s):

Physical Models ◽

Strained Si

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Evaluating high leakage effects of low V/sub TH/ circuits using high V/sub TH/ devices

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309487 ◽

2004 ◽

Author(s):

T. Miyazaki ◽

T. Sakurai

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A novel RFCMOS process monitoring test structure

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04 ◽

10.1109/icmts.2004.1309299 ◽

2004 ◽

Cited By ~ 2

Author(s):

C.B. Sia ◽

B.H. Ong ◽

K.M. Lim ◽

K.S. Yeo ◽

M.A. Do ◽

...

Keyword(s):

Process Monitoring ◽

Test Structure ◽

Monitoring Test

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Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

ICMTS 2004 Chairman's Letter

Design and measurements of test element group wafer thinned to 10 μm for 3D system in package

Test chip characterization of X architecture diagonal lines for SoC design

Leakage current correction in quasi-static C-V measurements

Further study of V/sub TH/-mismatch evaluation circuit

On-chip di/dt detector circuit for power supply line

Measuring the span of stress asymmetries on high-precision matched devices

Device characterizations and physical models of strained-Si channel CMOS

Evaluating high leakage effects of low V/sub TH/ circuits using high V/sub TH/ devices

A novel RFCMOS process monitoring test structure

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04
Latest Publications